Citation Alerts

Friday, July 9, 2010

ISI Web of Knowledge Alert - Thompson, P

ISI Web of Knowledge Citation Alert

Cited Article: Thompson, P. A general boundary condition for liquid flow at solid surfaces
Alert Expires: 09 NOV 2010
Number of Citing Articles: 1 new records this week (1 in this e-mail)
Organization ID: 3b97d1bbc1878baed0ab183d8b03130b
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Title:
Boundary slip dependency on surface stiffness

Authors:
Asproulis, N; Drikakis, D

Author Full Names:
Asproulis, Nikolaos; Drikakis, Dimitris

Source:
PHYSICAL REVIEW E 81 (6): Art. No. 061503 Part 1 JUN 24 2010

Language:
English

Document Type:
Article

KeyWords Plus:
MOLECULAR-DYNAMICS SIMULATION; FLUID-SOLID INTERFACE; SHEAR-FLOW; LIQUID; ROUGHNESS

Abstract:
The paper investigates the effects of surface stiffness on the slip process aiming to obtain a better insight of the momentum transfer at nanoscale. The surface stiffness is modeled through the stiffness, kappa, of spring potentials, which are employed to construct the thermal walls. It is shown that variations of stiffness, kappa, influence the slip mechanism either toward slip or stick conditions. Increasing the values of kappa alters the oscillation frequency and the mean displacement of the wall particles toward higher and lower values, respectively. Our results suggest that the amount of slip produced as a function of stiffness follows a common pattern that can be modeled through a fifth-order polynomial function.

Reprint Address:
Asproulis, N, Cranfield Univ, Dept Aerosp Sci, Fluid Mech & Computat Sci Grp, Cranfield MK43 0AL, Beds, England.

Research Institution addresses:
[Asproulis, Nikolaos; Drikakis, Dimitris] Cranfield Univ, Dept Aerosp Sci, Fluid Mech & Computat Sci Grp, Cranfield MK43 0AL, Beds, England

E-mail Address:
d.drikakis@cranfield.ac.uk

Cited References:
ALLEN MP, 1987, COMPUTER SIMULATION.
BARRAT JL, 1999, PHYS REV LETT, V82, P4671.
BARRAT JL, 2003, BASIC CONCEPTS SIMPL.
BINDER K, 2004, J PHYS-CONDENS MAT, V16, S429.
BONACCURSO E, 2003, PHYS REV LETT, V90, ARTN 144501.
BRANAM RD, 2009, NANOSC MICROSC THERM, V13, P1, DOI 10.1080/15567260802625866.
CHOI CH, 2003, PHYS FLUIDS, V15, P2897, DOI 10.1063/1.1605425.
CIEPLAK M, 2001, PHYS REV LETT, V86, P803.
COTTINBIZONNE C, 2003, NAT MATER, V2, P237, DOI 10.1038/nmat857.
COTTINBIZONNE C, 2004, EUR PHYS J E, V15, P427, DOI 10.1140/epje/i2004-10061-9.
GALEA TM, 2004, LANGMUIR, V20, P3477, DOI 10.1021/la035880k.
GREST GS, 1986, PHYS REV A, V33, P3628.
JABBARZADEH A, 1999, J CHEM PHYS, V110, P2612.
KIM BH, 2008, MICROFLUID NANOFLUID, V5, P551, DOI 10.1007/s10404-008-0267-7.
KOPLIK J, 1989, PHYS FLUIDS A-FLUID, V1, P781.
PETERSEN KE, 1978, IEEE T ELECTRON DEV, V25, P1241.
PRIEZJEV NV, 2005, PHYS REV E 1, V71, ARTN 041608.
PRIEZJEV NV, 2006, J FLUID MECH, V554, P25, DOI 10.1017/S0022112006009086.
PRIEZJEV NV, 2007, J CHEM PHYS, V127, P44708, ARTN 144708.
SBRAGAGLIA M, 2006, PHYS REV LETT, V97, ARTN 204503.
SOFOS FD, 2009, PHYS REV E 2, V79, ARTN 026305.
THOMPSON PA, 1990, PHYS REV A, V41, P6830.
THOMPSON PA, 1997, NATURE, V389, P360.
TRETHEWAY DC, 2002, PHYS FLUIDS, V14, L9.
YI P, 2002, INT J HEAT MASS TRAN, V45, P2087.
ZHU YX, 2001, PHYS REV LETT, V87, ARTN 096105.
ZHU YX, 2002, PHYS REV LETT, V88, ARTN 106102.

Cited Reference Count:
27

Times Cited:
0

Publisher:
AMER PHYSICAL SOC; ONE PHYSICS ELLIPSE, COLLEGE PK, MD 20740-3844 USA

Subject Category:
Physics, Fluids & Plasmas; Physics, Mathematical

ISSN:
1539-3755

DOI:
10.1103/PhysRevE.81.061503

IDS Number:
615WT

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ISI Web of Knowledge Alert - Hummer, G

ISI Web of Knowledge Citation Alert

Cited Article: Hummer, G. Water conduction through the hydrophobic channel of a carbon nanotube
Alert Expires: 09 NOV 2010
Number of Citing Articles: 3 new records this week (3 in this e-mail)
Organization ID: 3b97d1bbc1878baed0ab183d8b03130b
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Title:
Interaction of Water Molecules with Graphene: A Density Functional Theory and Molecular Dynamics Study

Authors:
Abe, S; Nagoya, Y; Watari, F; Tachikawa, H

Author Full Names:
Abe, Shigeaki; Nagoya, Yoshinori; Watari, Fumio; Tachikawa, Hiroto

Source:
JAPANESE JOURNAL OF APPLIED PHYSICS 49 (1): Art. No. 01AH07 Sp. Iss. SI 2010

Language:
English

Document Type:
Article

KeyWords Plus:
CARBON NANOTUBES; DIFFUSION DYNAMICS; AMORPHOUS-CARBON; THYMINE DIMER; SURFACE; ION

Abstract:
The evaporation processes of water from the edge region of graphene sheets was investigated by means of the direct molecular orbital-molecular dynamics (MO-MD) method at the AM1 level. Five graphenes with n = 1, 7, 19, 37, and 61 (where n is the number of benzene rings in the graphene) were examined as models of graphene sheets. The edge carbons of each graphene were terminated by hydrogen atoms. In the H2O-graphene interaction system, the oxygen atom of the water molecule binds to one or two C-H hydrogen atoms of the edge carbons. The binding energy of H2O increased gradually as a function of n and was saturated around n = 61. At low temperature (10-100 K), the water molecule was still connected to the graphene sheet, whereas the evaporation of H2O was found above 300 K. The mechanism of water evaporation is discussed on the basis of theoretical results. (C) 2010 The Japan Society of Applied Physics

Reprint Address:
Abe, S, Hokkaido Univ, Grad Sch Dent Med, Dept Biomed Dent Med & Engn, Sapporo, Hokkaido 0608586, Japan.

Research Institution addresses:
[Abe, Shigeaki; Watari, Fumio] Hokkaido Univ, Grad Sch Dent Med, Dept Biomed Dent Med & Engn, Sapporo, Hokkaido 0608586, Japan; [Nagoya, Yoshinori; Tachikawa, Hiroto] Hokkaido Univ, Grad Sch Engn, Div Mat Chem, Sapporo, Hokkaido 0608628, Japan

E-mail Address:
sabe@den.hokudai.ac.jp

Cited References:
*GAUSS INC, 2003, GAUSS 03 REV B 04.
HUMMER G, 2001, NATURE, V414, P188.
NGUYEN CV, 2002, NANO LETT, V2, P1079, DOI 10.1021/nl025689f.
NOON WH, 2002, CHEM PHYS LETT, V355, P445.
RANA M, 2007, J CHEM SCI, V119, P367.
TACHIKAWA H, 2005, J PHYS CHEM B, V109, P13255, DOI 10.1021/jp051418s.
TACHIKAWA H, 2006, J CHEM PHYS, V125, ARTN 133119.
TACHIKAWA H, 2006, J CHEM PHYS, V125, ARTN 144307.
TACHIKAWA H, 2006, J PHYS CHEM A, V110, P153, DOI 10.1021/jp0550659.
TACHIKAWA H, 2006, J PHYS CHEM B, V110, P20445, DOI 10.1021/jp0616031.
TACHIKAWA H, 2007, J CHEM PHYS, V126, ARTN 194310.
TACHIKAWA H, 2008, CHEM PHYS LETT, V462, P321, DOI 10.1016/j.cplett.2008.07.107.
TACHIKAWA H, 2008, J PHYS CHEM B, V112, P7315, DOI 10.1021/jp801564t.
TACHIKAWA H, 2008, J PHYS CHEM C, V112, P10193, DOI 10.1021/jp800398y.
WERDER T, 2001, NANO LETT, V1, P697, DOI 10.1021/nl015640u.
WERDER T, 2003, J PHYS CHEM B, V107, P1345, DOI 10.1021/jp0268112.

Cited Reference Count:
16

Times Cited:
0

Publisher:
JAPAN SOC APPLIED PHYSICS; KUDAN-KITA BUILDING 5TH FLOOR, 1-12-3 KUDAN-KITA, CHIYODA-KU, TOKYO, 102-0073, JAPAN

Subject Category:
Physics, Applied

ISSN:
0021-4922

DOI:
10.1143/JJAP.49.01AH07

IDS Number:
617NY

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Title:
Structures and Electronic States of Water Molecules on Graphene Surface: A Density Functional Theory Study

Authors:
Abe, S; Nagoya, Y; Watari, F; Tachikawa, H

Author Full Names:
Abe, Shigeaki; Nagoya, Yoshinori; Watari, Fumio; Tachikawa, Hiroto

Source:
JAPANESE JOURNAL OF APPLIED PHYSICS 49 (6): Art. No. 06GJ13 Part 2 Sp. Iss. SI 2010

Language:
English

Document Type:
Article

KeyWords Plus:
CARBON NANOTUBES; DIFFUSION DYNAMICS; AMORPHOUS-CARBON; THYMINE DIMER; SIMULATION; ION; MD

Abstract:
Effects of water molecules on the electronic states of graphene have been investigated by means of density functional theory (DFT) and time-dependent DFT methods at the PW91PW91 and B3LYP/6-31G(d) levels of theory. Solvation caused by one to four water molecules (n = 1-4) was examined in the present study. A graphene composed of 14 benzene rings was used as a model of finite-sized graphene (C42H16). The water molecules interact with the graphene surface via hydrogen bonding. The band gap of graphene was slightly red-shifted by the solvation. This shift was caused by the formation of hydrogen bonds between H2O and the graphene surface. The electronic states of the graphene-water system were discussed on the basis of theoretical results. (C) 2010 The Japan Society of Applied Physics

Reprint Address:
Abe, S, Hokkaido Univ, Grad Sch Dent Med, Dept Biomed Dent Med & Engn, Sapporo, Hokkaido 0608586, Japan.

E-mail Address:
sabe@den.hokudai.ac.jp

Cited References:
*GAUSS INC, 2003, AB IN MO CALC PROGR.
HUMMER G, 2001, NATURE, V414, P188.
NGUYEN CV, 2002, NANO LETT, V2, P1079, DOI 10.1021/nl025689f.
NOON WH, 2002, CHEM PHYS LETT, V355, P445.
RANA M, 2007, J CHEM SCI, V119, P367.
TACHIKAWA H, 2005, J PHYS CHEM B, V109, P13255, DOI 10.1021/jp051418s.
TACHIKAWA H, 2006, J CHEM PHYS, V125, ARTN 133119.
TACHIKAWA H, 2006, J CHEM PHYS, V125, ARTN 144307.
TACHIKAWA H, 2006, J PHYS CHEM A, V110, P153, DOI 10.1021/jp0550659.
TACHIKAWA H, 2006, J PHYS CHEM B, V110, P20445, DOI 10.1021/jp0616031.
TACHIKAWA H, 2007, J CHEM PHYS, V126, ARTN 194310.
TACHIKAWA H, 2008, CHEM PHYS LETT, V462, P321, DOI 10.1016/j.cplett.2008.07.107.
TACHIKAWA H, 2008, J PHYS CHEM B, V112, P7315, DOI 10.1021/jp801564t.
TACHIKAWA H, 2008, J PHYS CHEM C, V112, P10193, DOI 10.1021/jp800398y.
TACHIKAWA H, 2009, THIN SOLID FILMS, V518, P877, DOI 10.1016/j.tsf.2009.07.108.
WERDER T, 2001, NANO LETT, V1, P697, DOI 10.1021/nl015640u.
WERDER T, 2003, J PHYS CHEM B, V107, P1345, DOI 10.1021/jp0268112.

Cited Reference Count:
17

Times Cited:
0

Publisher:
JAPAN SOC APPLIED PHYSICS; KUDAN-KITA BUILDING 5TH FLOOR, 1-12-3 KUDAN-KITA, CHIYODA-KU, TOKYO, 102-0073, JAPAN

Subject Category:
Physics, Applied

ISSN:
0021-4922

DOI:
10.1143/JJAP.49.06GJ13

IDS Number:
613GB

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Title:
INOR 65-AgI@SWCNT: Low dimensional nanoaggregates and energy storage

Authors:
Leoni, S; Mercuri, F; Baldoni, M; Sgamellotti, A; Seifert, G

Author Full Names:
Leoni, Stefano; Mercuri, Francesco; Baldoni, Matteo; Sgamellotti, Antonio; Seifert, Gotthard, Sr.

Source:
ABSTRACTS OF PAPERS OF THE AMERICAN CHEMICAL SOCIETY 235: - 65-INOR APR 6 2008

Language:
English

Document Type:
Meeting Abstract

KeyWords Plus:
CARBON NANOTUBES

Research Institution addresses:
[Leoni, Stefano] Max Planck Inst Chem Phys Solids, D-01187 Dresden, Germany; [Baldoni, Matteo] Univ Perugia, Dept Chem, I-06123 Perugia, Italy; [Mercuri, Francesco] ISTM CNR, Dept Chem, I-06123 Perugia, Italy; [Sgamellotti, Antonio] Italian Natl Res Council CNR, Ist Mol Sci & Technol ISTM, Dept Chem, I-06123 Perugia, Italy; [Seifert, Gotthard, Sr.] Tech Univ Dresden, D-01062 Dresden, Germany

E-mail Address:
leoni@cpfs.mpg.de; merc@thch.unipg.it; Gotthard.Seifert@chemie.tu-dresden.de

Cited References:
AJAYAN PM, 1993, NATURE, V361, P333.
BALDONI M, UNPUB.
BALDONI M, 2007, SMALL, V10, P1730.
HAN WQ, 1997, SCIENCE, V277, P1287.
HUMMER G, 2001, NATURE, V414, P188.
KOGA K, 2001, NATURE, V412, P802.
MEYER RR, 2000, SCIENCE, V289, P1324.
XIA YN, 2003, ADV MATER, V15, P353.

Cited Reference Count:
8

Times Cited:
0

Publisher:
AMER CHEMICAL SOC; 1155 16TH ST, NW, WASHINGTON, DC 20036 USA

Subject Category:
Chemistry, Multidisciplinary

ISSN:
0065-7727

IDS Number:
519OA

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ISI Web of Knowledge Alert - Holt JK

ISI Web of Knowledge Citation Alert

Cited Article: Holt JK. Fast mass transport through sub-2-nanometer carbon nanotubes
Alert Expires: 09 NOV 2010
Number of Citing Articles: 1 new records this week (1 in this e-mail)
Organization ID: 3b97d1bbc1878baed0ab183d8b03130b
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PT J
*Record 1 of 1.
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AU Kim, J
Van der Bruggen, B
AF Kim, Jeonghwan
Van der Bruggen, Bart
TI The use of nanoparticles in polymeric and ceramic membrane structures:
Review of manufacturing procedures and performance improvement for
water treatment
SO ENVIRONMENTAL POLLUTION
LA English
DT Review
DE Membrane separation; Nanoparticles; Nanotubes; Fouling mitigation
ID COMPOSITE TFC MEMBRANE; NANO-SIZED ALUMINA; CMP WASTE-WATER;
ULTRAFILTRATION MEMBRANES; CARBON NANOTUBES; TIO2 NANOPARTICLES;
PHOTOCATALYTIC DEGRADATION; MICROFILTRATION MEMBRANES; NANOCOMPOSITE
MEMBRANES; SILVER NANOPARTICLES
AB Membrane separations are powerful tools for various applications,
including wastewater treatment and the removal of contaminants from
drinking water. The performance of membranes is mainly limited by
material properties. Recently, successful attempts have been made to
add nanoparticles or nanotubes to polymers in membrane synthesis, with
particle sizes ranging from 4 nm up to 100 nm. Ceramic membranes have
been fabricated with catalytic nanoparticles for synergistic effects on
the membrane performance. Breakthrough effects that have been reported
in the field of water and wastewater treatment include fouling
mitigation, improvement of permeate quality and flux enhancement.
Nanomaterials that have been used include titania, alumina, silica,
silver and many others. This paper reviews the role of engineered
nanomaterials in (pressure driven) membrane technology for water
treatment, to be applied in drinking water production and wastewater
recycling. Benefits and drawbacks are described, which should be taken
into account in further studies on potential risks related to release
of nanoparticles into the environment. (C) 2010 Elsevier Ltd. All
rights reserved.
C1 [Van der Bruggen, Bart] Katholieke Univ Leuven, Dept Chem Engn, Lab Appl Phys Chem & Environm Technol, B-3001 Heverlee, Belgium.
[Kim, Jeonghwan] Inha Univ, Dept Environm Engn, Inchon 402751, South Korea.
RP Van der Bruggen, B, Katholieke Univ Leuven, Dept Chem Engn, Lab Appl
Phys Chem & Environm Technol, W de Croylaan 46, B-3001 Heverlee,
Belgium.
EM bart.vanderbruggen@cit.kuleuven.be
CR *AWWA MEMBR TECHN, 2005, J AWWA, V97, P79
ACHARYA M, 1999, J MEMBRANE SCI, V161, P1
AERTS P, 2000, J MEMBRANE SCI, V176, P63
ARTALE MA, 2001, ANN CHIM-ROME, V91, P127
AZRAGUE J, 2005, J MEMBRANE SCI, V258, P71, DOI
10.1016/j.memsci.2005.02.027
AZRAGUE K, 2007, APPL CATAL B-ENVIRON, V72, P197, DOI
10.1016/j.apcatb.2006.10.007
BAE TH, 2005, J MEMBRANE SCI, V249, P1, DOI 10.1016/j.memsci.2004.09.008
BAE TH, 2006, J MEMBRANE SCI, V275, P1, DOI 10.1016/j.memsci.2006.01.023
BAILEY DA, 2000, J MEMBRANE SCI, V176, P1
BATTIN TJ, 2009, ENVIRON SCI TECHNOL, V43, P8098, DOI 10.1021/es9017046
BHAVE RR, 1991, INORGANIC MEMBRANES
BOCCACCINI AR, 2010, J EUR CERAM SOC, V30, P1115, DOI
10.1016/j.jeurceramsoc.2009.03.016
BOTTINO A, 2002, DESALINATION, V146, P35
BRUNET L, 2008, ENVIRON ENG SCI, V25, P565, DOI 10.1089/ees.2007.0076
CHAE SR, 2009, J MEMBRANE SCI, V329, P68, DOI
10.1016/j.memsci.2008.12.023
CHOI JH, 2006, J MEMBRANE SCI, V284, P406, DOI
10.1016/j.memsei.2006.08.013
CHOI JH, 2007, MACROMOL SYMP, V249, P610, DOI 10.1002/masy.200750444
CHOI JH, 2009, J APPL POLYM SCI, V111, P2186, DOI 10.1002/app.29222
CHOI WY, 1994, J PHYS CHEM-US, V98, P13669
CHOU WL, 2005, POLYM ADVAN TECHNOL, V16, P600, DOI 10.1002/pat.630
CORTALEZZI MM, 2002, J MEMBRANE SCI, V205, P33
CORTALEZZI MM, 2003, J MEMBRANE SCI, V227, P207, DOI
10.1016/j.memsci.2003.08.027
DEFRIEND KA, 2003, J MEMBRANE SCI, V224, P11, DOI
10.1016/S0376-7388(03)00344-2
DIGIANO FA, 2008, IWA MEMBR RES C AUG
DING XB, 2006, J MEMBRANE SCI, V270, P179, DOI
10.1016/j.memsci.2005.07.003
DUKE MC, 2007, WATER RES, V41, P3998, DOI 10.1016/j.watres.2007.05.028
ESUMI K, 1996, CARBON, V34, P279
GENNE I, 1996, J MEMBRANE SCI, V113, P343
GU YF, 1999, J EUR CERAM SOC, V19, P1961
HACKLEY VA, 1992, J MEMBRANE SCI, V70, P41
HAYASHI J, 1997, J MEMBRANE SCI, V124, P243
HELIN H, 2008, J ENVIRON SCI, V20, P565
HINDS BJ, 2004, SCIENCE, V303, P62, DOI 10.1126/science.1092048
HOEK EMV, 2005, 11364885, US, APPL
HOEK EMV, 2005, 60660428, US
HOLT JK, 2006, SCIENCE, V312, P1034, DOI 10.1126/science.1126298
ISMAIL AF, 2009, SEP PURIF TECHNOL, V70, P12, DOI
10.1016/j.seppur.2009.09.002
IWAMOTO S, 2000, J MATER SCI LETT, V19, P1439
IWAMOTO SH, 2005, CHEM MATER, V17, P65
JADAV GL, 2009, J MEMBRANE SCI, V328, P257, DOI
10.1016/j.memsci.2008.12.014
JEONG BH, 2007, J MEMBRANE SCI, V294, P1, DOI
10.1016/j.memsci.2007.02.025
JIRAGE KB, 1997, SCIENCE, V278, P655
JONES CD, 2001, J MEMBRANE SCI, V193, P175
KARNIK BS, 2005, ENVIRON SCI TECHNOL, V39, P7656, DOI 10.1021/es0503938
KARNIK BS, 2005, WATER RES, V39, P728
KARNIK BS, 2006, J MATER SCI, V41, P6861, DOI 10.1007/s10853-006-0943-5
KIM J, 2008, J MEMBRANE SCI, V311, P165, DOI
10.1016/j.memsci.2007.12.010
KIM SH, 2003, J MEMBRANE SCI, V211, P157
KLEINE J, 2002, CHEM ENG SCI, V57, P1661
KRITIKAKI A, 2009, J EUR CERAM SOC, V29, P1603, DOI
10.1016/j.jeurceramsoc.2008.10.011
KWAK SY, 2001, ENVIRON SCI TECHNOL, V35, P2388
LAM CW, 2006, CRIT REV TOXICOL, V36, P189, DOI 10.1080/10408440600570233
LEE HJ, 2003, J MATER SCI, V38, P2199
LEE HS, 2008, DESALINATION, V219, P48, DOI 10.1016/j.desal.2007.06.003
LEE SY, 2007, POLYM ADVAN TECHNOL, V18, P562, DOI 10.1002/pat.918
LI JB, 2007, J APPL POLYM SCI, V103, P3623, DOI 10.1002/app.25428
LI JF, 2009, APPL SURF SCI, V255, P4725, DOI
10.1016/j.apsusc.2008.07.139
LI JH, 2009, J MEMBRANE SCI, V326, P659, DOI
10.1016/j.memsci.2008.10.049
LI LX, 2004, J MEMBRANE SCI, V243, P401, DOI
10.1016/j.memsci.2004.06.045
LIN HF, 2002, SEP PURIF TECHNOL, V28, P87
LUO ML, 2005, APPL SURF SCI, V249, P76, DOI 10.1016/j.apsusc.2004.11.054
LV YH, 2009, J MEMBRANE SCI, V331, P50, DOI 10.1016/j.memsci.2009.01.007
MA L, 2009, J MEMBRANE SCI, V336, P109
MA N, 2009, J MEMBRANE SCI, V335, P58
MAJHI A, 2009, J MEMBRANE SCI, V340, P181, DOI
10.1016/j.memsci.2009.05.030
MANSOURPANAH Y, 2009, J MEMBRANE SCI, V330, P297, DOI
10.1016/j.memsci.2009.01.001
MAUTER MS, 2008, ENVIRON SCI TECHNOL, V42, P5843, DOI 10.1021/es8006904
MCKENZIE KJ, 2002, NEW J CHEM, V26, P625
MOERMANS B, 2000, CHEM COMMUN, P2467
MOLINARI R, 2002, J MEMBRANE SCI, V206, P399
MOLINARI R, 2004, CHEM ENG PROCESS, V43, P1103, DOI
10.1016/j.cep.2004.01.008
MOON JM, 2001, J PHYS CHEM B, V105, P5677, DOI 10.1021/jp0102365
MOZIA S, 2008, SEP PURIF TECHNOL, V63, P386, DOI
10.1016/j.seppur.2008.05.029
MOZIA S, 2009, CHEM ENG J, P152
NARAYAN RJ, 2005, MAT SCI ENG B-SOLID, V123, P123, DOI
10.1016/j.mseb.2005.07.007
NAZZAL FF, 1994, J MEMBRANE SCI, V93, P91
NOMURA T, 1997, WATER SCI TECHNOL, V35, P137
PANESSAWARREN BJ, 2009, ENVIRON POLLUT, V157, P1140, DOI
10.1016/j.envpol.2008.12.028
PARRA S, 2004, APPL CATAL B-ENVIRON, V51, P107, DOI
10.1016/j.apcatb.2004.01.021
RAHAMAN MN, 1995, CERAMIC PROCESSING S
RAHIMPOUR A, 2008, J MEMBRANE SCI, V313, P158, DOI
10.1016/j.memsei.2007.12.075
RANE N, 2005, J MEMBRANE SCI, V256, P89, DOI
10.1016/j.memsci.2005.02.009
ROSE J, 2002, CHEM MATER, V14, P621
SAEKHOW O, 2009, J MATER CHEM, V19, P3713, DOI 10.1039/b822879e
SCHFLETT MB, 1999, SCIENCE, V285, P1902
SCHLICHTER B, 2004, DESALINATION, V168, P307
SHAFFER MSP, 1998, CARBON, V36, P1603
SON WK, 2004, MACROMOL RAPID COMM, V25, P1632, DOI
10.1002/marc.200400323
SU YL, 2009, J MEMBRANE SCI, V329, P246, DOI
10.1016/j.memsci.2009.01.002
SYAFEI AD, 2008, J COLLOID INTERF SCI, V323, P112, DOI
10.1016/j.jcis.2008.03.037
TARABARA VV, 2009, NANOTECHNOLOGY APPL, P59
TAUROZZI JS, 2008, J MEMBRANE SCI, V325, P58, DOI
10.1016/j.memsci.2008.07.010
TEJRAL G, 2009, J APPL BIOMED, V7, P1
TIEDE K, 2009, J CHROMATOGR A, V1216, P503, DOI
10.1016/j.chroma.2008.09.008
TSURU T, 2001, J CHEM ENG JPN, V34, P844
TSURU T, 2001, SEPAR PURIF METHOD, V30, P191
VENKATACHALAM K, 2008, J HAZARD MATER, V159, P483, DOI
10.1016/j.jhazmat.2008.02.109
VERMISOGIOU EC, 2008, MICROPOR MESOPOR MAT, V110, P25, DOI
10.1016/j.micromeso.2007.08.001
VERWEIJ H, 2007, SMALL, V12, P1996
VOZNYAKOVSKII AP, 2008, FULLER NANOTUB CAR N, V16, P654, DOI
10.1080/15363830802314145
WU GP, 2008, APPL SURF SCI, V254, P7080, DOI
10.1016/j.apsusc.2008.05.221
XU J, 2005, ENVIRON PROG, V24, P358, DOI 10.1002/ep.10106
XU J, 2007, IND ENG CHEM RES, V46, P2348, DOI 10.1021/ie0611498
XU J, 2008, J PHYS CHEM C, V112, P9133, DOI 10.1021/jp7097262
YAN GCC, 2008, DESALINATION, V234, P354
YAN L, 2005, POLYMER, V46, P7701, DOI 10.1016/j.polymer.2005.05.155
YAN L, 2006, J MEMBRANE SCI, V276, P162, DOI
10.1016/j.memsci.2005.09.044
YAN L, 2009, SEP PURIF TECHNOL, V66, P347, DOI
10.1016/j.seppur.2008.12.015
YANG GCC, 2008, DESALINATION, V234, P354, DOI
10.1016/j.desal.2007.09.104
YANG GCC, 2008, J MEMBRANE SCI, V321, P232, DOI
10.1016/j.memsci.2008.04.060
YANG JX, 2009, DESALINATION, V239, P29, DOI 10.1016/j.desal.2008.03.004
YANG YN, 2007, J MEMBRANE SCI, V288, P231, DOI
10.1016/j.memsci.2006.11.019
YAO Y, 2008, LANGMUIR, V24, P7072, DOI 10.1021/la801202d
YU DG, 2003, J MEMBRANE SCI, V225, P115, DOI
10.1016/j.memsci.2003.08.010
ZHANG Q, 2009, SEP PURIF TECHNOL, V66, P306, DOI
10.1016/j.seppur.2008.12.010
ZHANG XW, 2008, APPL CATAL B-ENVIRON, V84, P262, DOI
10.1016/j.apcatb.2008.04.009
ZHAO GJ, 1998, BIOMETALS, V11, P27
ZHOU SY, 2008, J MEMBRANE SCI, V325, P546, DOI
10.1016/j.memsci.2008.08.024
ZODROW K, 2009, WATER RES, V43, P715, DOI 10.1016/j.watres.2008.11.014
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ISI Web of Knowledge Alert - Lichter S

ISI Web of Knowledge Citation Alert

Cited Article: Lichter S. Mechanisms for liquid slip at solid surfaces
Alert Expires: 09 NOV 2010
Number of Citing Articles: 1 new records this week (1 in this e-mail)
Organization ID: 3b97d1bbc1878baed0ab183d8b03130b
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Title:
Effects of Channel Scale on Slip Length of Flow in Micro/Nanochannels

Authors:
Yang, XF; Zheng, ZQC

Author Full Names:
Yang, Xiaofan; Zheng, Zhongquan C.

Source:
JOURNAL OF FLUIDS ENGINEERING-TRANSACTIONS OF THE ASME 132 (6): Art. No. 061201 JUN 2010

Language:
English

Document Type:
Article

Author Keywords:
microchannel flow; molecular dynamics method; nanofluidics; slip flow

KeyWords Plus:
MOLECULAR-DYNAMICS; BOUNDARY-CONDITIONS; MICRO-FLUIDICS; HYBRID METHOD; CONTINUUM; SIMULATION; PARTICLE; COMPUTATIONS; MODEL

Abstract:
The concept of slip length, related to surface velocity and shear rate, is often used to analyze the slip surface property for flow in micro- or nanochannels. In this study, a hybrid scheme that couples molecular dynamics simulation (used near the solid boundary to include the surface effect) and a continuum solution (to study the fluid mechanics) is validated and used for the study of slip length behavior in the Couette flow problem. By varying the height of the channel across multiple length scales, we investigate the effect of channel scale on surface slip length. In addition, by changing the velocity of the moving-solid wall, the influence of shear rate on the slip length is studied. The results show that within a certain range of the channel heights, the slip length is size dependent. This upper bound of the channel height can vary with the shear rate. Under different magnitudes of moving velocities and channel heights, a relative slip length can be introduced, which ch!
anges with channel height following a logarithmic function, with the coefficients of the function being the properties of the fluid and wall materials. [DOI: 10.1115/1.4001619]

Reprint Address:
Yang, XF, Kansas State Univ, Dept Mech & Nucl Engn, Manhattan, KS 66506 USA.

Research Institution addresses:
[Yang, Xiaofan; Zheng, Zhongquan C.] Kansas State Univ, Dept Mech & Nucl Engn, Manhattan, KS 66506 USA

E-mail Address:
xiaofan@ksu.edu; zzheng@ksu.edu

Cited References:
ALLEN MP, 1989, COMPUTER SIMULATION.
ANDERSEN HC, 1980, J CHEM PHYS, V72, P2384.
BERENDSEN HJC, 1984, J CHEM PHYS, V81, P8.
CIEPLAK M, 2001, PHYS REV LETT, V86, P803.
CUI J, 2006, ACTA MECH SINICA, V22, P503, DOI 10.1007/s10409-006-0034-5.
DELGADOBUSCALIONI R, 2003, PHYS REV E 2, V67, ARTN 046704.
FLEKKOY EG, 2000, EUROPHYS LETT, V52, P271.
FRENKEL D, 1996, UNDERSTANDING MOL SI.
HADJICONSTANTINOU NG, 1997, INT J MOD PHYS C, V8, P967.
KOPLIK J, 1989, PHYS FLUIDS A-FLUID, V1, P781.
KOPLIK J, 1995, ANNU REV FLUID MECH, V27, P257.
KOUMOUTSAKOS P, 2005, ANNU REV FLUID MECH, V37, P457, DOI 10.1146/annurev.fluid.37.061903.175753.
LI J, 1998, PHYS REV E, V57, P7259.
LICHTER S, 2004, PHYS REV LETT, V93, ARTN 086001.
LICHTER S, 2007, PHYS REV LETT, V22, UNSP 226001.
MARTINI A, 2008, J FLUID MECH, V600, P257, DOI 10.1017/S0022112008000475.
MARTINI A, 2008, PHYS REV LETT, V100, ARTN 206001.
NIE XB, 2004, J FLUID MECH, V500, P55, DOI 10.1017/S0022112003007225.
OCONNELL ST, 1995, PHYS REV E A, V52, R5792.
RAPAPORT D, 2004, ART MOL DYNAMICS SIM.
REN WQ, 2005, J COMPUT PHYS, V204, P1, DOI 10.1016/j.jcp.2004.10.001.
THOMPSON D, 1997, NATURE, V389, P675.
THOMPSON PA, 1990, PHYS REV A, V41, P6830.
WANG YC, 2007, CHEM ENG SCI, V62, P3574, DOI 10.1016/j.ces.2006.12.093.
WERDER T, 2005, J COMPUT PHYS, V205, P373, DOI 10.1016/j.jcp.2004.11.019.
XU JL, 2007, INT J HEAT MASS TRAN, V50, P2571, DOI 10.1016/j.ijheatmasstransfer.2006.11.031.
YEN TH, 2007, MICROFLUID NANOFLUID, V3, P665, DOI 10.1007/s10404-007-0154-7.

Cited Reference Count:
27

Times Cited:
0

Publisher:
ASME-AMER SOC MECHANICAL ENG; THREE PARK AVE, NEW YORK, NY 10016-5990 USA

Subject Category:
Engineering, Mechanical

ISSN:
0098-2202

DOI:
10.1115/1.4001619

IDS Number:
615EW

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ISI Web of Knowledge Alert - Majumder M

ISI Web of Knowledge Citation Alert

Cited Article: Majumder M. Nanoscale hydrodynamics - Enhanced flow in carbon nanotubes
Alert Expires: 09 NOV 2010
Number of Citing Articles: 1 new records this week (1 in this e-mail)
Organization ID: 3b97d1bbc1878baed0ab183d8b03130b
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Title:
Waveguide Modes and Adhesion Conditions for Flow in a Nanochannel

Authors:
Ershova, AA; Popov, IY; Chivilikhin, SA; Gusarov, VV

Author Full Names:
Ershova, A. A.; Popov, I. Yu.; Chivilikhin, S. A.; Gusarov, V. V.

Source:
DOKLADY PHYSICS 55 (6): 271-273 JUN 2010

Language:
English

Document Type:
Article

KeyWords Plus:
CARBON NANOTUBES

Reprint Address:
Ershova, AA, St Petersburg State Univ Informat Technol Mech &, St Petersburg, Russia.

Research Institution addresses:
[Ershova, A. A.; Popov, I. Yu.; Chivilikhin, S. A.] St Petersburg State Univ Informat Technol Mech &, St Petersburg, Russia; [Gusarov, V. V.] Tech Univ, St Petersburg State Technol Inst, St Petersburg, Russia

E-mail Address:
popov@mail.info.ru

Cited References:
ALBEVERIO S, 1991, SOLVABLE MODELS QUAN.
BAZ AI, 1971, SCATTERING REACTIONS.
CHEN X, 2008, NANO LETT, V8, P2988, DOI 10.1021/nl802046b.
CHIVILIKHIN SA, 2008, RUSSIAN J MATH PHYS, V15, P410.
DEMKOV YN, 1975, ZERO RANGE POTENTIAL.
FRENKEL YI, 1975, KINETIC THEORY FLUID.
GERJUOY E, 1965, J MATH PHYS, V6, P993.
INSEPOV Z, 2006, NANO LETT, V6, P1893, DOI 10.1021/nl060932m.
KONONOVA SV, 2007, ZH PRIKL KHIM, V80, P2064.
MAJUMDER M, 2005, NATURE, V438, P44, DOI 10.1038/43844a.
MASLOV VP, 2007, THEOR MATH PHYS, V153, P388.
PAVLOV BS, 1989, MAT SBORNIK, V137, P147.
SONY J, 2008, NANO LETT, V8, P452.
WHITBY M, 2008, NANO LETT, V8, P2632, DOI 10.1021/nl080705f.

Cited Reference Count:
14

Times Cited:
0

Publisher:
MAIK NAUKA/INTERPERIODICA/SPRINGER; 233 SPRING ST, NEW YORK, NY 10013-1578 USA

Subject Category:
Mechanics; Physics, Multidisciplinary

ISSN:
1028-3358

DOI:
10.1134/S1028335810060066

IDS Number:
614BD

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Friday, July 2, 2010

ISI Web of Knowledge Alert - Ghosh, S

ISI Web of Knowledge Citation Alert

Cited Article: Ghosh, S. Carbon nanotube flow sensors
Alert Expires: 09 NOV 2010
Number of Citing Articles: 2 new records this week (2 in this e-mail)
Organization ID: 3b97d1bbc1878baed0ab183d8b03130b
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Title:
Integration of SWNT film into MEMS for a micro-thermoelectric device

Authors:
Van, TD; Dzung, VD; Yamada, T; Bui, TT; Hata, K; Sugiyama, S

Author Full Names:
Van Thanh Dau; Dzung Viet Dao; Yamada, Takeo; Bui Thanh Tung; Hata, Kenji; Sugiyama, Susumu

Source:
SMART MATERIALS & STRUCTURES 19 (7): Art. No. 075003 JUL 2010

Language:
English

Document Type:
Article

KeyWords Plus:
WALLED CARBON NANOTUBES; ONE-DIMENSIONAL NANOSTRUCTURES; POWER; TRANSPORT; STRENGTH

Abstract:
This paper reports the top-down fabrication of carbon nanotube (CNT) thin film on microelectrical mechanical systems (MEMS) and the characterization of the thermoelectric coefficients of aligned single-walled carbon nanotube (SWNT) forest film. The film was synthesized by water-assisted chemical vapor deposition (CVD), a process known as 'super-growth'. CNT film was then condensed, manually maneuvered, and conveniently patterned by electron beam (EB) lithography to form desirable shapes. We demonstrate this process by patterning an array of Au-CNT thermocouples; measurement under room temperature conditions reveals the Seebeck coefficient of aligned SWNT film to be 18-20 mu V C-1.

Reprint Address:
Van, TD, Sumitomo Chem Co Ltd, Agr Chem Res Lab, Res Grp Environm Hlth, 2-1 Takatsukasa 4 Chome, Takarazuka, Hyogo 6658555, Japan.

Research Institution addresses:
[Yamada, Takeo; Hata, Kenji] Natl Inst Adv Ind Sci & Technol, Nanotube Res Ctr, Tsukuba Ctr 5, Tsukuba, Ibaraki 3058565, Japan; [Van Thanh Dau; Dzung Viet Dao; Bui Thanh Tung; Sugiyama, Susumu] Ritsumeikan Univ, Grad Sch Sci & Engn, Shiga 5258577, Japan

E-mail Address:
van@fc.ritsumei.ac.jp

Cited References:
BAXENDALE M, 2000, PHYS REV B, V61, P12705.
BERBER S, 2000, PHYS REV LETT, V84, P4613.
BRADLEY K, 2000, PHYS REV LETT, V85, P4361.
CHUNG JY, 2004, LANGMUIR, V20, P3011, DOI 10.1021/la035726y.
COLLINS PG, 2000, SCIENCE, V287, P1801.
EVOY S, 2004, MICROELECTRON ENG, V75, P31, DOI 10.1016/j.mee.2003.09.010.
FALVO MR, 1999, NATURE, V397, P236.
FALVO MR, 2000, PHYS REV B, V62, UNSP R10665-7.
FUKUDA T, 2003, P IEEE, V91, P1803, DOI 10.1109/JPROC.2003.818334.
GHOSH S, 2003, SCIENCE, V299, P1042, DOI 10.1126/science.1079080.
HATA K, 2004, SCIENCE, V306, P1362.
HAYAMIZU Y, 2008, NAT NANOTECHNOL, V3, P289, DOI 10.1038/nnano.2008.98.
HONE J, 1998, PHYS REV LETT, V80, P1042.
HONE J, 2000, APPL PHYS LETT, V77, P666.
HONEY K, 2005, NAT REV IMMUNOL, V5, P8, DOI 10.1038/nri1541.
HUANG Y, 2001, SCIENCE, V291, P630.
KANG N, 2003, PHYS REV B, V67, ARTN 033404.
KANG SJ, 2007, NAT NANOTECHNOL, V2, P230, DOI 10.1038/nnano.2007.77.
KIM P, 2001, PHYS REV LETT, V87, ARTN 215502.
KONG WJ, 2005, J PHYS-CONDENS MAT, V17, P1923, DOI 10.1088/0953-8984/37/12/015.
KUNADIAN I, 2009, CARBON, V47, P589, DOI 10.1016/j.carbon.2008.10.043.
LEWENSTEIN JC, 2002, NANO LETTERS, V2, P443.
LI XL, 2007, J AM CHEM SOC, V129, P4890, DOI 10.1021/ja071114e.
LIU J, 1999, CHEM PHYS LETT, V303, P125.
LLAGUNO MC, 2004, NANO LETT, V4, P45, DOI 10.1021/nl0348488.
POSTMA HWC, 2000, ADV MATER, V12, P1299.
RAMESH S, 2003, PHYS REV LETT, V90, UNSP 065503.
RAO SG, 2003, NATURE, V425, P36, DOI 10.1038/425036a.
ROMERO HE, 2002, PHYS REV B, V65, ARTN 205410.
SALALHA W, 2005, PHYS FLUIDS, V17, ARTN 063301.
SALVETAT JP, 1999, PHYS REV LETT, V82, P944.
SHI L, 2003, J HEAT TRANS-T ASME, V125, P881, DOI 10.1115/1.1597619.
SMALL JP, 2003, PHYS REV LETT, V91, ARTN 256801.
SOOD AK, 2004, PHYS REV LETT, V93, ARTN 086601.
SUMANASEKERA GU, 2000, PHYS REV LETT, V85, P1096.
TIAN ML, 1998, PHYS REV B, V58, P1166.
WONG EW, 1997, SCIENCE, V277, P1971.
YAMAMOTO K, 1998, J PHYS D, V31, P3403.
YU MF, 2000, SCIENCE, V287, P637.

Cited Reference Count:
39

Times Cited:
0

Publisher:
IOP PUBLISHING LTD; DIRAC HOUSE, TEMPLE BACK, BRISTOL BS1 6BE, ENGLAND

Subject Category:
Instruments & Instrumentation; Materials Science, Multidisciplinary

ISSN:
0964-1726

DOI:
10.1088/0964-1726/19/7/075003

IDS Number:
612UT

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Title:
Fullerene-based one-dimensional crystalline nanopolymer formed through topochemical transformation of the parent nanowire

Authors:
Geng, JF; Solov'yov, IA; Reid, DG; Skelton, P; Wheatley, AEH; Solov'yov, AV; Johnson, BFG

Author Full Names:
Geng, Junfeng; Solov'yov, Ilia A.; Reid, David G.; Skelton, Paul; Wheatley, Andrew E. H.; Solov'yov, Andrey V.; Johnson, Brian F. G.

Source:
PHYSICAL REVIEW B 81 (21): Art. No. 214114 JUN 17 2010

Language:
English

Document Type:
Article

KeyWords Plus:
INTERFACIAL PRECIPITATION METHOD; PRESSURE-POLYMERIZED C-60; CARBON NANOTUBES; STRUCTURAL-CHARACTERIZATION; BUCKMINSTERFULLERENE C-60; MAGNETIC-RESONANCE; CHEMICAL-SHIFTS; NMR; DENSITY; GROWTH

Abstract:
Large-scale practical applications of fullerene (C-60) in nanodevices could be significantly facilitated if the commercially available micrometer-scale raw C-60 powder were further processed into a one-dimensional nanowire-related polymer displaying covalent bonding as molecular interlinks and resembling traditional important conjugated polymers. However, there has been little study thus far in this area despite the abundant literature on fullerene. Here we report the preparation and characterization of such a C-60-based polymer nanowire, (-C60TMB-)(n), where TMB=1,2,4-trimethylbenzene, which displays a well-defined crystalline nanostructure, exceptionally large length-to-width ratio and excellent thermal stability. The material is prepared by first growing the corresponding nanowire through a solution phase of C-60 followed by a topochemical polymerization reaction in the solid state. Gas chromatography, mass spectrometry and C-13 nuclear magnetic resonance evidence is prov!
ided for the nature of the covalent bonding mode adopted by the polymeric chains. Theoretical analysis based on detailed calculations of the reaction energetics and structural analysis provides an in-depth understanding of the polymerization pathway. The nanopolymer promises important applications in biological fields and in the development of optical, electrical, and magnetic nanodevices.

Reprint Address:
Geng, JF, Univ Cambridge, Dept Chem, Lensfield Rd, Cambridge CB2 1EW, England.

Research Institution addresses:
[Geng, Junfeng; Reid, David G.; Skelton, Paul; Wheatley, Andrew E. H.; Johnson, Brian F. G.] Univ Cambridge, Dept Chem, Cambridge CB2 1EW, England; [Solov'yov, Ilia A.; Solov'yov, Andrey V.] Goethe Univ Frankfurt, Frankfurt Inst Adv Studies, D-60438 Frankfurt, Germany; [Solov'yov, Ilia A.; Solov'yov, Andrey V.] AF Ioffe Phys Tech Inst, St Petersburg 194021, Russia

E-mail Address:
jg201@cam.ac.uk; ilia@fias.uni-frankfurt.de

Cited References:
AKAI Y, 2005, PHYSICA E, V29, P555, DOI 10.1016/j.physe.2005.06.026.
BALCH AL, 1993, J CHEM SOC CHEM COMM, P56.
BAUGHMAN RH, 2002, SCIENCE, V297, P787.
BECKE AD, 1988, PHYS REV A, V38, P3098.
BUCHANAN GW, 1974, CAN J CHEM, V52, P3196.
BUERGI HB, 1994, CHEM MATER, V6, P1325.
CEOLIN R, 1999, CHEM PHYS LETT, V314, P21.
DEWAR MJS, 1985, J AM CHEM SOC, V107, P3902.
DITCHFIELD R, 1974, MOL PHYS, V27, P789.
DRESSELHAUS M, 1996, SCI FULLERENES CARBO.
EKLUND PC, 1995, THIN SOLID FILMS, V257, P185.
FORESMAN J, 1996, EXPLORING CHEM ELECT.
FRISCH MJ, 2004, GAUSSIAN 03 REVISION.
GAUSS J, 2000, PHYS CHEM CHEM PHYS, V2, P2083.
GECKELER KE, 1993, J AM CHEM SOC, V115, P3850.
GENG JF, 2005, J PHYS CHEM B, V109, P16665, DOI 10.1021/jp051544w.
GENG JF, 2008, J AM CHEM SOC, V130, P2527, DOI 10.1021/ja076392s.
GENG JF, 2009, J PHYS CHEM C, V113, P6390, DOI 10.1021/jp809664g.
GHOSH S, 2003, SCIENCE, V299, P1042, DOI 10.1126/science.1079080.
GOZE C, 1996, PHYS REV B, V54, R3676.
GUET C, 2001, ATOMIC CLUSTERS NANO.
GUSS W, 1994, PHYS REV LETT, V72, P2644.
HAMEKA HF, 1958, MOL PHYS, V1, P203.
HELLER DA, 2006, SCIENCE, V311, P508, DOI 10.1126/science.1120792.
HIRSCH A, 2005, FULLERENES CHEM REAC.
HOHENBERG P, 1964, PHYS REV, V136, B864, DOI 10.1103/PHYSREV.136.B864.
IWASA Y, 1994, SCIENCE, V264, P1570.
LEE C, 1988, PHYS REV B, V37, P785.
LIEBER CM, 2007, MRS BULL, V32, P99.
LINDGREN L, 1986, ATOMIC MANY BODY THE.
LIU HB, 2002, J AM CHEM SOC, V124, P13370, DOI 10.1021/ja0280527.
LONDON F, 1937, J PHYS-PARIS, V8, P397.
LYALIN A, 2003, PHYS REV A, V67, ARTN 063203.
LYALIN A, 2007, PHYS REV A, V75, ARTN 053201.
MATSUDA K, 2008, PHYS REV B, V77, ARTN 075421.
MIYAZAWA K, 2002, J MATER RES, V17, P2205.
MIYAZAWA K, 2003, SURF INTERFACE ANAL, V35, P117, DOI 10.1002/sia.1506.
MIYAZAWA K, 2004, T MAT RES SOC JPN, V29, P1965.
MIYAZAWA K, 2005, J MATER RES, V20, P688, DOI 10.1557/JMR.2005.0091.
MORANA M, 2008, ADV FUNCT MATER, V18, P1757, DOI 10.1002/adfm.200701428.
NAGASHIMA H, 1992, J CHEM SOC CHEM 0215, P377.
NUNEZREGUEIRO M, 1995, PHYS REV LETT, V74, P278.
PARR R, 1989, DENSITY FUNCTIONAL T.
PEKKER S, 1994, SCIENCE, V265, P1077.
PERSSON PA, 1996, CHEM PHYS LETT, V258, P540.
RAO AM, 1993, SCIENCE, V259, P955.
ROCHA GB, 2006, J COMPUT CHEM, V27, P1101, DOI 10.1002/jcc.20425.
SAITO R, 1992, PHYS REV B, V46, P9906.
SARICIFTCI NS, 1992, SCIENCE, V258, P1474.
SERVICE RF, 2001, SCIENCE, V293, P1570.
SOLDATOV AV, 2001, SCIENCE, V293, P680.
SOLOVYEVA V, 2009, THIN SOLID FILMS, V517, P6671, DOI 10.1016/j.tsf.2009.05.006.
SOLOVYOV A, 2004, LATEST ADV ATOMIC CL.
SOLOVYOV IA, 2002, PHYS REV A B, V65, ARTN 053203.
SOLOVYOV IA, 2006, J EXP THEOR PHYS+, V102, P314, DOI 10.1134/S1063776106020129.
SOLOVYOV IA, 2006, PHYS REV E 1, V73, ARTN 021916.
SOLOVYOV IA, 2008, PHYS REV E 1, V78, ARTN 051601.
SOLOVYOV IA, 2009, CHEM PHYS LETT, V472, P166, DOI 10.1016/j.cplett.2009.03.006.
SOLOYOV I, 2009, AIP C P, V1197, P89.
STOILOVA O, 2007, POLYMER, V48, P1835, DOI 10.1016/j.polymer.2007.02.026.
WANG L, 2006, ADV MATER, V18, P1883, DOI 10.1002/adma.200502738.
WANG Y, 1992, NATURE, V356, P585.
WOOLFEND.WR, 1966, J AM CHEM SOC, V88, P1496.
WUDL F, 1992, ACCOUNTS CHEM RES, V25, P157.
XU MS, 2008, NANOTECHNOLOGY, V19, P75712, ARTN 075712.
YAKUBOVICH AV, 2006, EUR PHYS J D, V39, P23, DOI 10.1140/epjd/e2006-00067-5.
ZHENG M, 2003, SCIENCE, V302, P1545.

Cited Reference Count:
67

Times Cited:
0

Publisher:
AMER PHYSICAL SOC; ONE PHYSICS ELLIPSE, COLLEGE PK, MD 20740-3844 USA

Subject Category:
Physics, Condensed Matter

ISSN:
1098-0121

DOI:
10.1103/PhysRevB.81.214114

IDS Number:
612CS

Please enter your account number here:

ISI Web of Knowledge Alert - Hummer, G

ISI Web of Knowledge Citation Alert

Cited Article: Hummer, G. Water conduction through the hydrophobic channel of a carbon nanotube
Alert Expires: 09 NOV 2010
Number of Citing Articles: 2 new records this week (2 in this e-mail)
Organization ID: 3b97d1bbc1878baed0ab183d8b03130b
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Title:
Gated Ion Transport through Dense Carbon Nanotube Membranes

Authors:
Yu, MA; Funke, HH; Falconer, JL; Noble, RD

Author Full Names:
Yu, Miao; Funke, Hans H.; Falconer, John L.; Noble, Richard D.

Source:
JOURNAL OF THE AMERICAN CHEMICAL SOCIETY 132 (24): 8285-8290 JUN 23 2010

Language:
English

Document Type:
Article

KeyWords Plus:
WATER-ADSORPTION; CHANNEL; SELECTIVITY; CONDUCTION

Abstract:
Gated ion diffusion is found widely in hydrophobic biological nanopores, upon changes in ligand binding, temperature, transmembrane voltage, and mechanical stress. Because water is the main media for ion diffusion in these hydrophobic biological pores, ion diffusion behavior through these nanochannels is expected to be influenced significantly when water wettability in hydrophobic biological nanopores is sensitive and changes upon small external changes. Here, we report for the first time that ion diffusion through highly hydrophobic nanopores (similar to 3 nm) showed a gated behavior due to change of water wettability on hydrophobic surface upon small temperature change or ultrasound. Dense carbon nanotube (CNT) membranes with both 3-nm CNTs and 3-nm interstitial pores were prepared by a solvent evaporation process and used as a model system to investigate ion diffusion behavior. Ion diffusion through these membranes exhibited a gated behavior. The ion flux was turned on an!
d off, apparently because the water wettability of CNTs changed. At 298 K, ion diffusion through dense CNT membranes stopped after a few hours, but it dramatically increased when the temperature was increased 20 K or the membrane was subjected to ultrasound. Likewise, water adsorption on dense CNT membranes increased dramatically at a water activity of 0.53 when the temperature increased from 293 to 306 K, indicating capillary condensation. Water adsorption isotherms of dense CNT membranes suggest that the adsorbed water forms a discontinuous phase at 293 K, but it probably forms a continuous layer, probably in the interstitial CNT regions, at higher temperatures. When the ion diffusion channel was opened by a temperature increase or ultrasound, ions diffused through the CNT membranes at a rate similar to bulk diffusion in water. This finding may have implications for using CNT membrane for desalination and water treatment.

Reprint Address:
Falconer, JL, Univ Colorado, Dept Chem & Biol Engn, Boulder, CO 80309 USA.

Research Institution addresses:
[Yu, Miao; Funke, Hans H.; Falconer, John L.; Noble, Richard D.] Univ Colorado, Dept Chem & Biol Engn, Boulder, CO 80309 USA

E-mail Address:
john.falconer@colorado.edu

Cited References:
BASS RB, 2002, SCIENCE, V298, P1582.
CHANG G, 1998, SCIENCE, V282, P2220.
CI LJ, 2007, ADV MAT, V19.
CUSSLER EL, 1984, DIFFUSION MASS TRANS.
DOYLE DA, 1998, SCIENCE, V280, P69.
FORNASIERO F, 2008, P NATL ACAD SCI USA, V105, P17250, DOI 10.1073/pnas.0710437105.
FUTABA DN, 2006, NAT MATER, V5, P987, DOI 10.1038/nmat1782.
HARPST JA, 1965, J PHYS CHEM-US, V69, P2333.
HATA K, 2004, SCIENCE, V306, P1362.
HINDS BJ, 2004, SCIENCE, V303, P62, DOI 10.1126/science.1092048.
HOLT JK, 2006, SCIENCE, V312, P1034, DOI 10.1126/science.1126298.
HUMMER G, 2001, NATURE, V414, P188.
KIM S, 2007, NANO LETT, V7, P2806, DOI 10.1021/nl071414u.
LI JY, 2007, P NATL ACAD SCI USA, V104, P3687, DOI 10.1073/pnas.0604541104.
MAJUMDER M, 2005, NATURE, V438, P44, DOI 10.1038/43844a.
MAO SH, 2006, CHEM PHYS LETT, V421, P513, DOI 10.1016/j.cplett.2006.02.011.
MURATA K, 2000, NATURE, V407, P599.
NISHIZAWA M, 1995, SCIENCE, V268, P700.
STRIOLO A, 2005, J CHEM PHYS, V122, ARTN 234712.
VOETS T, 2004, NATURE, V430, P748, DOI 10.1038/nature02732.
WANG HJ, 2008, SCIENCE, V322, P80, DOI 10.1126/science.1162412.
YU M, 2009, NANO LETT, V9, P225, DOI 10.1021/nl802816h.

Cited Reference Count:
22

Times Cited:
0

Publisher:
AMER CHEMICAL SOC; 1155 16TH ST, NW, WASHINGTON, DC 20036 USA

Subject Category:
Chemistry, Multidisciplinary

ISSN:
0002-7863

DOI:
10.1021/ja9091769

IDS Number:
612NJ

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Title:
Role of Electrostatics in Modulating Hydrophobic Interactions and Barriers to Hydrophobic Assembly

Authors:
Bauer, BA; Patel, S

Author Full Names:
Bauer, Brad A.; Patel, Sandeep

Source:
JOURNAL OF PHYSICAL CHEMISTRY B 114 (24): 8107-8117 JUN 24 2010

Language:
English

Document Type:
Article

KeyWords Plus:
MOLECULAR-DYNAMICS SIMULATIONS; POLARIZABLE FORCE-FIELD; CLASSICAL DRUDE OSCILLATORS; MONTE-CARLO SIMULATIONS; LIQUID-VAPOR INTERFACE; HYDROGEN-BOND DYNAMICS; SCALED-PARTICLE THEORY; FREE-ENERGY; TEMPERATURE-DEPENDENCE; SOLVENT POLARIZABILITY

Abstract:
Hydrophobic effects continue to be an active area of research due to implications for a wide range of physicochemical phenomena. Molecular dynamics simulations have been used extensively in the study of such effects using various water potential models, with few studies addressing the differences between models. In particular, studies considering the explicit treatment of water polarizability are underrepresented in the literature. We present results from molecular dynamics simulations that systematically compare the dependence of large-scale hydrophobic effects on the water model. We consider three common nonpolarizable models (SPC/E, TIP3P, and TIP4P) and two common polarizable models (TIP4P-FQ and SWM4-NDP). Results highlight the similarities and differences of the different water models in the vicinity of two large hydrophobic plates. In particular, profiles of average density, density fluctuations, orientation, and hydrogen bonding show only minor differences among the !
water models studied. However, the potential of mean force for the hydrophobe dimerization is significantly reduced in the polarizable water systems. TIP4P-FQ shows the deepest minimum of approximately -54(+/-3) kcal/mol compared to -40(+/-3), -40(+/-2), -42(+/-3), and -45(+/-5) kcal/mol for TIP4P, TEMP, SPC/E, and SWM4-NDP (all relative to the dissociated state). We discuss the relationship between hydrophobic association and the strength of water-water interactions in the liquid phase. Results suggest that models treating polarizability (both implicitly and explicitly) influence a stronger driving force toward hydrophobic assembly. Implications of these results, as well as prospectives on future work, are discussed.

Reprint Address:
Patel, S, Univ Delaware, Dept Chem & Biochem, Newark, DE 19716 USA.

Research Institution addresses:
[Bauer, Brad A.; Patel, Sandeep] Univ Delaware, Dept Chem & Biochem, Newark, DE 19716 USA

E-mail Address:
sapatel@udel.edu

Cited References:
ANISIMOV VM, 2005, J CHEM THEORY COMPUT, V1, P153, DOI 10.1021/ct049930p.
ANTHAWALE MV, 2007, P NATL ACAD SCI USA, V104, P733.
APPLEQUIST J, 1972, J AM CHEM SOC, V94, P2952.
ASHBAUGH HS, 2010, J CHEM PHYS, V132, ARTN 124504.
BADYAL YS, 2000, J CHEM PHYS, V112, P9206.
BALDWIN RL, 1986, P NATL ACAD SCI USA, V83, P8069.
BAUER BA, 2009, J CHEM THEORY COMPUT, V5, P359, DOI 10.1021/ct800320f.
BERENDSEN HJC, 1987, J PHYS CHEM-US, V91, P6269.
BEREZHKOVSKII A, 2002, PHYS REV LETT, V89, UNSP 064503.
BERNE BJ, 1996, P NATL ACAD SCI USA, V93, P8800.
BERNE BJ, 2009, ANNU REV PHYS CHEM, V60, P85, DOI 10.1146/annurev.physchem.58.032806.104445.
BROOKS BR, 2009, J COMPUT CHEM, V30, P1545, DOI 10.1002/jcc.21287.
CHANDLER D, 2005, NATURE, V437, P640, DOI 10.1038/nature04162.
CHOUDHURY N, 2010, J CHEM PHYS, V132, ARTN 064505.
CHOWDHARY J, 2009, J PHYS CHEM B, V113, P4045, DOI 10.1021/jp8061509.
DANG LX, 1994, J CHEM PHYS, V100, P9032.
DARDEN T, 1993, J CHEM PHYS, V98, P10089.
DILL KA, 1990, BIOCHEMISTRY-US, V29, P7155.
EWELL J, 2008, J PHYS CHEM B, V112, P10272, DOI 10.1021/jp804429n.
GEIGER A, 1979, J CHEM PHYS, V70, P263.
GHOSH T, 2005, J PHYS CHEM B, V109, P642, DOI 10.1021/jp0475638.
GIOVAMBATTISTA N, 2006, PHYS REV E 1, V73, ARTN 041604.
GIOVAMBATTISTA N, 2009, J PHYS CHEM B, V113, P13723, DOI 10.1021/jp9018266.
GODAWAT R, 2009, P NATL ACAD SCI USA, V106, P15119, DOI 10.1073/pnas.0902778106.
GODAWAT R, 2010, J PHYS CHEM B, V114, P2246, DOI 10.1021/jp906976q.
GORDILLO MC, 2005, J CHEM PHYS, V123, ARTN 054707.
GRANICK S, 2008, SCIENCE, V322, P1477, DOI 10.1126/science.1167219.
GRAZIANO G, 2009, J PHYS CHEM B, V113, P11232, DOI 10.1021/jp9025738.
GROSSFIELD A, 2003, J AM CHEM SOC, V125, P15671, DOI 10.1021/ja037005r.
HUA L, 2009, J PHYS CHEM C, V113, P5244, DOI 10.1021/jp8088758.
HUANG DM, 2000, P NATL ACAD SCI USA, V97, P8324.
HUANG X, 2003, J PHYS CHEM B, V107, P11742, DOI 10.1021/jp030652k.
HUANG X, 2003, P NATL ACAD SCI USA, V100, P11953, DOI 10.1073/pnas.1934837100.
HUMMER G, 1996, P NATL ACAD SCI USA, V93, P8951.
HUMMER G, 1998, J PHYS CHEM B, V102, P10469.
HUMMER G, 1998, PHYS REV LETT, V80, P4193.
HUMMER G, 2000, CHEM PHYS, V258, P349.
HUMMER G, 2001, NATURE, V414, P188.
JAMADAGNI SN, 2009, J PHYS CHEM B, V113, P4093, DOI 10.1021/jp806528m.
JONSSON M, 2006, J PHYS CHEM B, V110, P8782, DOI 10.1021/jp0604241.
JORGENSEN WL, 1983, J CHEM PHYS, V79, P926.
JORGENSEN WL, 1998, J COMPUT CHEM, V19, P1179.
JORGENSEN WL, 2005, P NATL ACAD SCI USA, V102, P6665, DOI 10.1073/pnas.0408037102.
KATHMANN SM, 2008, J AM CHEM SOC, V130, P16556, DOI 10.1021/ja802851w.
KATHMANN SM, 2009, J AM CHEM SOC, V131, P17522, DOI 10.1021/ja908142d.
KAUZMANN W, 1959, ADV PROTEIN CHEM, V14, P1.
KRISHTAL A, 2006, J CHEM PHYS, V125, ARTN 034312.
KUMAR P, 2005, PHYS REV E 1, V72, ARTN 051503.
KUO IFW, 2006, J PHYS CHEM B, V110, P3738, DOI 10.1021/jp056330t.
LAMOUREUX G, 2003, J CHEM PHYS, V119, P3025, DOI 10.1063/1.1589749.
LAMOUREUX G, 2003, J CHEM PHYS, V119, P5185, DOI 10.1063/1.1598191.
LAMOUREUX G, 2006, CHEM PHYS LETT, V418, P245, DOI 10.1016/j.cplett.2005.10.135.
LI X, 2006, J AM CHEM SOC, V128, P12439, DOI 10.1021/ja057944e.
LIU P, 2005, J PHYS CHEM B, V109, P2949, DOI 10.1021/jp0468071.
LOPES PEM, 2007, J PHYS CHEM B, V111, P2873, DOI 10.1021/jp0663614.
LUM K, 1997, PHYS REV E, V56, P6283.
LUM K, 1999, J PHYS CHEM B, V103, P4570.
LUZAR A, 2000, J CHEM PHYS, V113, P5836.
MCGRATH MJ, 2007, MOL PHYS, V105, P1411, DOI 10.1080/00268970701364938.
MITTAL J, 2008, P NATL ACAD SCI USA, V105, P20130, DOI 10.1073/pnas.0809029105.
NAGARAJAN R, 1991, LANGMUIR, V7, P2934.
NEW MH, 1995, J AM CHEM SOC, V117, P7172.
NOSE S, 1984, MOL PHYS, V52, P255.
PANGALI C, 1979, J CHEM PHYS, V71, P2975.
PANGALI C, 1979, J CHEM PHYS, V71, P2982.
PATEL AJ, 2010, J PHYS CHEM B, V114, P1632, DOI 10.1021/jp909048f.
PATEL S, 2004, J COMPUT CHEM, V25, P1, DOI 10.1002/jcc.10355.
PATEL S, 2004, J COMPUT CHEM, V25, P1504, DOI 10.1002/jcc.20077.
PATEL S, 2006, MOL SIMULAT, V32, P231, DOI 10.1080/08927020600726708.
PI HL, 2009, MOL PHYS, V107, P365, DOI 10.1080/00268970902784926.
PONDER JW, 2010, J PHYS CHEM B, V114, P2549, DOI 10.1021/jp910674d.
PRATT LR, 1977, J CHEM PHYS, V67, P3683.
PRATT LR, 1980, J CHEM PHYS, V73, P3430.
PRATT LR, 2002, ANNU REV PHYS CHEM, V53, P409, DOI 10.1146/annurev.physchem.53.090401.093500.
PRATT LR, 2002, CHEM REV, V102, P2671, DOI 10.1021/cr000692+.
RAPPE AK, 1991, J PHYS CHEM-US, V95, P3358.
RASAIAH JC, 2008, ANNU REV PHYS CHEM, V59, P713, DOI 10.1146/annurev.physchem.59.032607.093815.
REN PY, 2002, J COMPUT CHEM, V23, P1497, DOI 10.1002/jcc.10127.
REN PY, 2003, J PHYS CHEM B, V107, P5933, DOI 10.1021/jp027815+.
RICK SW, 1994, J CHEM PHYS, V101, P6141.
RICK SW, 1995, J MOL LIQ, V65, P31.
RICK SW, 1997, J PHYS CHEM B, V101, P10488.
RICK SW, 2000, J PHYS CHEM B, V104, P6884, DOI 10.1021/jp000841s.
RICK SW, 2001, J CHEM PHYS, V114, P2276.
RYCKAERT JP, 1977, J COMPUT PHYS, V23, P327.
SARUPRIA S, 2009, PHYS REV LETT, V103, ARTN 037803.
SETNY P, 2009, PHYS REV LETT, V103, ARTN 187801.
SILVESTRELLI PL, 1999, PHYS REV LETT, V82, P3308.
SMITH DE, 1993, J CHEM PHYS, V98, P6445.
SOUTHALL NT, 2002, J PHYS CHEM B, V106, P521, DOI 10.1021/jp015514e.
SPRIK M, 1991, J CHEM PHYS, V95, P6762.
STILLINGER FH, 1973, J SOLUTION CHEM, V2, P141.
TANFORD C, 1962, J AM CHEM SOC, V84, P4240.
TANFORD C, 1997, PROTEIN SCI, V6, P1358.
THOLE BT, 1981, CHEM PHYS, V59, P341.
VAITHEESWARAN S, 2004, P NATL ACAD SCI USA, V101, P17002, DOI 10.1073/pnas.0407968101.
VANBELLE D, 1993, J AM CHEM SOC, V115, P647.
WALLQVIST A, 1995, J PHYS CHEM-US, V99, P2885.
WALLQVIST A, 2001, J PHYS CHEM B, V105, P6745.
WERDER T, 2003, J PHYS CHEM B, V107, P1345, DOI 10.1021/jp0268112.
WIDOM B, 2003, PHYS CHEM CHEM PHYS, V5, P3085, DOI 10.1039/b304038k.
WILLARD AP, 2008, J PHYS CHEM B, V112, P6187, DOI 10.1021/jp077186+.
YOUNG WS, 1997, J CHEM PHYS, V106, P9265.
YU HB, 2010, J CHEM THEORY COMPUT, V6, P774, DOI 10.1021/ct900576a.
ZANGI R, 2007, J AM CHEM SOC, V129, P4678, DOI 10.1021/ja068305m.
ZANGI R, 2008, J PHYS CHEM B, V112, P8634, DOI 10.1021/jp802135c.
ZANGI R, 2009, J AM CHEM SOC, V131, P1535, DOI 10.1021/ja807887g.
ZANGI R, 2010, J PHYS CHEM B, V114, P643, DOI 10.1021/jp909034c.
ZHU S, 2010, J CHEM THEORY COMPUT, V6.

Cited Reference Count:
109

Times Cited:
0

Publisher:
AMER CHEMICAL SOC; 1155 16TH ST, NW, WASHINGTON, DC 20036 USA

Subject Category:
Chemistry, Physical

ISSN:
1520-6106

DOI:
10.1021/jp101995d

IDS Number:
611TM

Please enter your account number here:

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