Thursday, September 24, 2009

ISI Web of Knowledge Alert - Ghosh, S

ISI Web of Knowledge Citation Alert

Cited Article: Ghosh, S. Carbon nanotube flow sensors
Alert Expires: 22 OCT 2009
Number of Citing Articles: 1 new records this week (1 in this e-mail)
Organization ID: 3b97d1bbc1878baed0ab183d8b03130b
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Title:
Electrooptic and dielectric properties of ferroelectric liquid crystal/single walled carbon nanotubes dispersions confined in thin cells

Authors:
Podgornov, FV; Suvorova, AM; Lapanik, AV; Haase, W

Author Full Names:
Podgornov, Fedor V.; Suvorova, Anastasia M.; Lapanik, Artsiom V.; Haase, Wolfgang

Source:
CHEMICAL PHYSICS LETTERS 479 (4-6): 206-210 SEP 17 2009

Language:
English

Document Type:
Article

KeyWords Plus:
CRYSTALS; FIELD

Abstract:
Electrooptic and dielectric properties of ferroelectric liquid crystals/chiral carbon nanotubes dispersions were investigated. It was demonstrated that even a small amount of chiral single walled carbon nanotubes affects greatly the performance of ferroelectric liquid crystal cells. Particularly, the spontaneous polarization, the Goldstone mode dielectric strength and the rise time are decreased in doped cells.
The experimental results are explained by two effects. First, the spontaneous polarization of the FLC is screened by the pi-pi electron system of the carbon nanotube. Secondly, pi electrons trap the ionic impurities which results in significant modification of the internal electric field inside the cells. (c) 2009 Elsevier B.V. All rights reserved.

Reprint Address:
Podgornov, FV, S Ural State Univ, Dept Phys, Lenin Ave 76, Chelyabinsk 454080, Russia.

Research Institution addresses:
[Podgornov, Fedor V.; Suvorova, Anastasia M.] S Ural State Univ, Dept Phys, Chelyabinsk 454080, Russia; [Podgornov, Fedor V.; Lapanik, Artsiom V.; Haase, Wolfgang] Tech Univ Darmstadt, Eduard Zintl Inst Inorgan & Phys Chem, D-64287 Darmstadt, Germany

E-mail Address:
fedorpod@yahoo.de

Cited References:
BAIK IS, 2005, APPL PHYS LETT, V87, ARTN 263110.
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BLINOV LM, 2005, PHYS REV E 1, V71, ARTN 051715.
CHEN HY, 2005, OPT REV, V12, P223.
CHEN HY, 2005, P SPIE, V5947.
CHEN HY, 2006, APPL PHYS LETT, V88, ARTN 222105.
DIERKING I, 2005, J APPL PHYS, V97, ARTN 044309.
GHOSH S, 2003, SCIENCE, V299, P1042, DOI 10.1126/science.1079080.
GHOSH S, 2005, CHEM PHYS LETT, V406, P10, DOI 10.1016/j.cplett.2005.02.088.
HAASE W, 2006, GREAT LAK PHOT S DAY.
HILL NE, 1969, DIELECTRIC PROPERTIE.
HUANG CY, 2005, JPN J APPL PHYS 1, V44, P8077, DOI 10.1143/JJAP.44.8077.
HUANG CY, 2006, APPL PHYS LETT, V89, ARTN 056101.
HUANG Y, 2007, CARBON, V45, P1614, DOI 10.1016/j.carbon.2007.04.016.
JEON SY, 2006, APPL PHYS LETT, V89, ARTN 056102.
LAGERWALL ST, 1999, FERROELECTRIC ANTIFE.
LEE W, 2007, JPN J APPL PHYS 1, V46, P2962, DOI 10.1143/JJAP.46.2962.
LYNCH MD, 2002, NANO LETT, V2, P1197, DOI 10.1021/nl025694j.
MARTINOTLAGARDE P, 1981, MOL CRYST LIQUID CRY, V75, P249.
SCALIA G, 2006, PHYS STATUS SOLIDI B, V243, P3238, DOI 10.1002/pssb.200669205.
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TU XM, 2009, NATURE, V460, P250, DOI 10.1038/nature08116.

Cited Reference Count:
22

Times Cited:
0

Publisher:
ELSEVIER SCIENCE BV; PO BOX 211, 1000 AE AMSTERDAM, NETHERLANDS

Subject Category:
Chemistry, Physical; Physics, Atomic, Molecular & Chemical

ISSN:
0009-2614

DOI:
10.1016/j.cplett.2009.08.005

IDS Number:
493GQ

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