Friday, September 10, 2010

ISI Web of Knowledge Alert - Thompson, P

ISI Web of Knowledge Citation Alert

Cited Article: Thompson, P. A general boundary condition for liquid flow at solid surfaces
Alert Expires: 09 NOV 2010
Number of Citing Articles: 2 new records this week (2 in this e-mail)
Organization ID: 3b97d1bbc1878baed0ab183d8b03130b
========================================================================
Note: Instructions on how to purchase the full text of an article and Help Desk Contact information are at the end of the e-mail.
========================================================================

*Record 1 of 2.
*View Full Record: http://gateway.isiknowledge.com/gateway/Gateway.cgi?GWVersion=2&SrcAuth=Alerting&SrcApp=Alerting&DestApp=WOS&DestLinkType=FullRecord;KeyUT=000281307400011
*Order Full Text [ ]

Title:
Microscale Falling Cylinder Viscometer With Slip Boundary

Authors:
Bataineh, KM; Al-Nimr, MA; Batayneh, W

Author Full Names:
Bataineh, Khaled M.; Al-Nimr, Moh'd A.; Batayneh, Wafa

Source:
JOURNAL OF FLUIDS ENGINEERING-TRANSACTIONS OF THE ASME 132 (8): Art. No. 084502 AUG 2010

Language:
English

Document Type:
Article

Author Keywords:
microfluidics; microchannel flow; falling cylinder viscometer; slip flow; analytical solution

KeyWords Plus:
HYDROPHOBIC MICROCHANNEL WALLS; SOLID-SURFACES; CONTACT-LINE; FLUID SLIP; LIQUID; PRESSURE; WATER; FLOW; SINGULARITY; INTERFACES

Abstract:
This paper theoretically investigates the hydrodynamic behavior of a falling microcylinder viscometer. The Navier slip conditions are applied to all fluid/solid interfacial boundary conditions of the device. Previous investigations focused on the behavior at the macroscale level and did not consider the slip conditions. The slip coefficients for typical devices and operating conditions are found to be major parameters that affect the behavior of the microscale viscometer. Formulas for determining the viscosity coefficients using a microscale viscometer without considering slip conditions give inaccurate results. The theoretical model has been verified by comparing its predictions with that of the macroviscometer after neglecting the slip conditions. [DOI: 10.1115/1.4002168]

Reprint Address:
Bataineh, KM, Jordan Univ Sci & Technol, Dept Mech Engn, Irbid 22110, Jordan.

Research Institution addresses:
[Bataineh, Khaled M.; Al-Nimr, Moh'd A.; Batayneh, Wafa] Jordan Univ Sci & Technol, Dept Mech Engn, Irbid 22110, Jordan

E-mail Address:
k.bataineh@just.edu.jo

Cited References:
ARKILIC EB, 1997, J MICROELECTROMECH S, V6, P167.
ASHARE E, 1965, AICHE J, V11, P910.
BATAINEH KM, 2009, ASME, V131, UNSP 051105.
BIRD B, 2002, TRANSPORT PHENOMENA.
BIRD BR, 1987, DYNAMICS POLYM LIQUI.
BRIDGMAN PW, 1926, P AM ACAD ARTS SCI, V61, P57.
CHAN RKY, 1985, J PHYS E SCI INSTRUM, V18, P510.
CHEN MCS, 1968, AICHE J, V14, P123.
CHEN MCS, 1972, AICHE J, V18, P146.
CHOI CH, 2003, PHYS FLUIDS, V15, P2897, DOI 10.1063/1.1605425.
CHURAEV NV, 1984, J COLLOID INTERF SCI, V97, P574.
COTTINBIZONNE C, 2003, NAT MATER, V2, P237, DOI 10.1038/nmat857.
CRAIG VSJ, 2001, PHYS REV LETT, V87, ARTN 054504.
CRISTESCU ND, 2002, INT J ENG SCI, V40, P605.
DUSSANV EB, 1976, J FLUID MECH, V77, P665.
EICHSTADT FJ, 1966, AICHE J, V12, P1179.
GADELHAK M, 1999, ASME, V121, P5.
GADELHAK M, 2002, HDB MEMS.
HOCKING LM, 1977, J FLUID MECH, V79, P209.
IRVING JB, 1971, J PHYS E, V4, P232.
KARNIADAKIS G, 2002, MICRO FLOW FUNDAMENT.
LAMB H, 1932, HYDRODYNAMICS, P594.
LOHRENZ J, 1960, AICHE J, V6, P547.
NAVIER CLM, 1823, MEM ACAD SCI I FR, V6, P432.
NAVIER CLM, 1823, MEMOIRES ACAD ROYALE, V6, P389.
ONEILL ME, 1986, PHYS FLUIDS, V29, P913.
PARANJAPE BV, 1990, PHYS CHEM LIQ, V21, P147.
PIT R, 2000, PHYS REV LETT, V85, P980.
RUCKENSTEIN E, 1983, J COLLOID INTERF SCI, V96, P488.
SCHNELL E, 1956, J APPL PHYS, V27, P1149.
SPIKES H, 2003, LANGMUIR, V19, P5065, DOI 10.1021/la034123j.
SWIFT GW, 1960, AICHE J, V6, P415.
THOMPSON PA, 1997, NATURE, V389, P360.
TRANSONTAY R, 1988, REV SCI INSTRUM, V59, P1399.
TRETHEWAY DC, 2002, PHYS FLUIDS, V14, L9.
VINOGRADOVA OI, 1999, INT J MINER PROCESS, V56, P31.
WATANABE K, 1999, J FLUID MECH, V381, P225.
WEHBEH EG, 1993, PHYS FLUIDS A-FLUID, V5, P25.
ZHU LD, 2005, J COMPUT PHYS, V202, P181, DOI 10.1016/j.jcp.2004.07.004.
ZHU YX, 2001, PHYS REV LETT, V87, ARTN 096105.

Cited Reference Count:
40

Times Cited:
0

Publisher:
ASME-AMER SOC MECHANICAL ENG; THREE PARK AVE, NEW YORK, NY 10016-5990 USA

Subject Category:
Engineering, Mechanical

ISSN:
0098-2202

DOI:
10.1115/1.4002168

IDS Number:
643OT

========================================================================

*Record 2 of 2.
*View Full Record: http://gateway.isiknowledge.com/gateway/Gateway.cgi?GWVersion=2&SrcAuth=Alerting&SrcApp=Alerting&DestApp=WOS&DestLinkType=FullRecord;KeyUT=000281199000095
*Order Full Text [ ]

Title:
State-of-art of Slip Flow in Nanochannel

Authors:
Zhang, XL; Liu, K; Li, T; Xiao, Y; Ba, DC; Wu, CM

Author Full Names:
Zhang Xiao-ling; Liu Kun; Li Tao; Xiao Yu; Ba De-chun; Wu Chun-mei

Source:
VACUUM TECHNOLOGY AND SURFACE ENGINEERING - PROCEEDINGS OF THE 9TH VACUUM METALLURGY AND SURFACE ENGINEERING CONFERENCE : 512-516 2009

Language:
English

Document Type:
Proceedings Paper

Author Keywords:
Micro-nanofluidics; Nanochannel; Velocity slip

KeyWords Plus:
HYDROPHOBIC MICROCHANNELS; BOUNDARY-CONDITION; LIQUID FLOW; NANOFLUIDICS; WATER

Abstract:
In the fields of micro-nanofluidics studies, with the channel from the micro into the nano-scale, surface properties have changed dramatically. The nano-scale slip flow of fluid has brought a significant impact on fluid transport. This article briefly introduces velocity slip factors in the nanochannel, including channel potential energy, temperatures, variable cross-section and wall roughness and so on..

Reprint Address:
Zhang, XL, Northeastern Univ, Shenyang 11004, Peoples R China.

Research Institution addresses:
[Zhang Xiao-ling; Liu Kun; Li Tao; Xiao Yu; Ba De-chun] Northeastern Univ, Shenyang 11004, Peoples R China

Cited References:
BIZONNE CC, 2005, PHYS REV LETT, V94, UNSP 056102.
CAO BY, 2006, ACTA PHYS SIN-CH ED, V55, P5305.
CHOI CH, 2003, PHYS FLUIDS, V15, P2897, DOI 10.1063/1.1605425.
CIEPLAK M, 2001, PHYS REV LETT, V86, P803.
CRAIG VSJ, 2001, PHYS REV LETT, UNSP 87054504.
EIJKEL J, 2007, LAB CHIP, V7, P299, DOI 10.1039/b700364c.
EIJKEL JCT, 2005, LAB CHIP, V5, P1202, DOI 10.1039/b509819j.
GADELHAK M, 2001, MEC IND, V2, P313.
GRANICK S, 1991, SCIENCE, V253, P1374.
MUKHOPADHYAY R, 2006, ANAL CHEM, V78, P7379.
SUGIYAMA W, 1996, VACUUM, V47, P791.
TAS NR, 2003, NANO LETT, V3, P1537, DOI 10.1021/nl034676e.
THOMPSON PA, 1989, PHYS REV LETT, V63, P766.
THOMPSON PA, 1997, NATURE, V389, P360.
TRETHEWAY DC, 2004, PHYS FLUIDS, V16, P1509, DOI 10.1063/1.1669400.
VOIKOV IV, 1988, COMP MATH MATH PHYS, V28, P52.
XIANG H, 2008, J ENG THERMOPHYSICS, V29, P1557.
XU C, 2005, J ENG THERMOPHYSICS, V26, P912.
ZHU YX, 2002, PHYS REV LETT, V88, ARTN 106102.

Cited Reference Count:
19

Times Cited:
0

Publisher:
PUBLISHING HOUSE ELECTRONICS INDUSTRY; PO BOX 173 WANSHOU ROAD, BEIJING 100036, PEOPLES R CHINA

IDS Number:
BQK17

========================================================================
*Order Full Text*
All Customers
--------------
Please contact your library administrator, or person(s) responsible for
document delivery, to find out more about your organization's policy for
obtaining the full text of the above articles. If your organization does
not have a current document delivery provider, your administrator can
contact ISI Document Solution at service@isidoc.com, or call 800-603-4367
or 734-459-8565.

IDS Customers
--------------
IDS customers can purchase the full text of an article (having page number,
volume, and issue information) by returning this ENTIRE message as a Reply
to Sender or Forward to orders@isidoc.com. Mark your choices with an X in
the "Order Full Text: []" brackets for each item. For example, [X].

Please enter your account number here:

========================================================================
*Help Desk Contact Information*
If you have any questions, please visit the Thomson Scientific Technical Support Contact Information Web page:
http://www.thomsonscientific.com/support/techsupport
========================================================================

No comments: