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| Title: REVIEW OF THE EFFECTS OF SURFACE TOPOGRAPHY, SURFACE CHEMISTRY, AND FLUID PHYSICS ON EVAPORATION AT THE CONTACT LINE |
| Authors: |
| Author Full Names: Plawsky, Joel L.; Ojha, Manas; Chatterjee, Arya; Wayner, Peter C., Jr. |
| Source: CHEMICAL ENGINEERING COMMUNICATIONS 196 (5): 658-696 2009 |
| Language: English |
| Document Type: Review |
| Author Keywords: Evaporation; Roughness; Wetting |
| Keywords Plus: BOILING HEAT-TRANSFER; SUPER-WATER-REPELLENT; BIOMIMETIC SUPERHYDROPHOBIC SURFACES; CONDENSING SESSILE DROPLET; VOLATILE LIQUID DROPLETS; ROUGH SURFACES; SOLID-SURFACES; THIN-FILM; HYDROPHOBIC SURFACES; WETTING PROPERTIES |
| Abstract: Liquid-vapor phase-change processes are becoming increasingly important in a wide variety of fields ranging from energy conversion, to microelectronics cooling, MEMs devices, and self-assembly. The phase change in these systems is governed by processes that occur at the contact line, where three phases meet. Evidence suggests that alterations of the surface chemistry and surface topography on the nanoscale can be used to dramatically enhance the phase-change process. This article reviews the current state of the art in nanoscale surface modification as applied to the enhancement of evaporative processes. |
| Reprint Address: Plawsky, J, Rensselaer Polytech Inst, Dept Chem & Biol Engn, Ricketts Bldg,110 8th St, Troy, NY 12180 USA. |
| Research Institution addresses: [Plawsky, Joel L.; Ojha, Manas; Chatterjee, Arya; Wayner, Peter C., Jr.] Rensselaer Polytech Inst, Dept Chem & Biol Engn, Troy, NY 12180 USA |
| E-mail Address: plawsky@rpi.edu |
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| Cited Reference Count: 141 |
| Times Cited: 0 |
| Publisher: TAYLOR & FRANCIS INC; 325 CHESTNUT ST, SUITE 800, PHILADELPHIA, PA 19106 USA |
| Subject Category: Engineering, Chemical |
| ISSN: 0098-6445 |
| DOI: 10.1080/00986440802569679 |
| IDS Number: 383EE |
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