Cited Article: Holt JK. Fast mass transport through sub-2-nanometer carbon nanotubes
Alert Expires: 18 OCT 2009
Number of Citing Articles: 1 new records this week (1 in this e-mail)
Organization ID: 3b97d1bbc1878baed0ab183d8b03130b
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AU Lee, SW
Kim, BS
Chen, S
Shao-Horn, Y
Hammond, PT
AF Lee, Seung Woo
Kim, Byeong-Su
Chen, Shuo
Shao-Horn, Yang
Hammond, Paula T.
TI Layer-by-Layer Assembly of All Carbon Nanotube Ultrathin Films for
Electrochemical Applications
SO JOURNAL OF THE AMERICAN CHEMICAL SOCIETY
LA English
DT Article
ID NONCOVALENT SIDEWALL-FUNCTIONALIZATION; FUEL-CELLS; POLYELECTROLYTE
MULTILAYERS; ELECTRICAL-PROPERTIES; STORAGE DEVICES; ELECTRODES;
ENERGY; COMPOSITES; TRANSPARENT; PERFORMANCE
AB All multiwall carbon nanotube (MWNT) thin films are created by
layer-by-layer (LBL) assembly of surface functionalized MWNTs.
Negatively and positively charged MWNTs were prepared by surface
functionalization, allowing the incorporation of MWNTs into highly
tunable thin films via the LBL technique. The pH dependent surface
charge on the MWNTs gives this system the unique characteristics of LBL
assembly of weak polyelectrolytes, controlling thickness and morphology
with assembly pH conditions. We demonstrate that these MWNT thin films
have randomly oriented interpenetrating network structure with well
developed nanopores using AFM and SEM, which is an ideal structure of
functional materials for various applications. In particular,
electrochemical measurements of these all-MWNT thin film electrodes
show high electronic conductivity in comparison with polymer composites
with single wall nanotubes, and high capacitive behavior with precise
control of capacity.
C1 [Chen, Shuo] MIT, Dept Mech Engn, Cambridge, MA 02139 USA.
[Lee, Seung Woo; Kim, Byeong-Su; Hammond, Paula T.] MIT, Dept Chem Engn, Cambridge, MA 02139 USA.
[Lee, Seung Woo; Chen, Shuo; Shao-Horn, Yang] MIT, Electrochem Energy Lab, Cambridge, MA 02139 USA.
[Shao-Horn, Yang] MIT, Dept Mat Sci & Engn, Cambridge, MA 02139 USA.
RP Shao-Horn, Y, MIT, Dept Mech Engn, Cambridge, MA 02139 USA.
EM shaohorn@mit.edu
hammond@mit.edu
CR *CRC, 1998, CRC HDB CHEM PHYS
AGO H, 1999, J PHYS CHEM B, V103, P8116
AJAYAN PM, 2001, CARBON NANOTUBES, V80, P391
AN KH, 2002, J ELECTROCHEM SOC, V149, A1058, DOI 10.1149/1.1491235
ARICO AS, 2005, NAT MATER, V4, P366, DOI 10.1038/nmat1368
BAKER SE, 2002, NANO LETT, V2, P1413, DOI 10.1021/nl025729f
BAUGHMAN RH, 1999, SCIENCE, V284, P1340
BAUGHMAN RH, 2002, SCIENCE, V297, P787
BERNHOLC J, 2002, ANN REV MATER RES, V32, P347, DOI
10.1146/annurev.matsci.32.112601.134925
CHEN J, 1998, SCIENCE, V282, P95
CHEN RJ, 2001, J AM CHEM SOC, V123, P3838
CHOI J, 2005, MACROMOLECULES, V38, P116, DOI 10.1021/ma048596o
CIOCAN R, 2005, NANO LETT, V5, P2389, DOI 10.1021/nl0514644
DECHER G, 1997, SCIENCE, V277, P1232
ESUMI K, 1996, CARBON, V34, P279
FRACKOWIAK E, 1999, CARBON, V37, P61
FRACKOWIAK E, 2001, CARBON, V39, P937
FUTABA DN, 2006, NAT MATER, V5, P987, DOI 10.1038/nmat1782
HARRIS JJ, 1999, J AM CHEM SOC, V121, P1978
HOLT JK, 2006, SCIENCE, V312, P1034, DOI 10.1126/science.1126298
KIM YT, 2006, J POWER SOURCES, V158, P1517, DOI
10.1016/j.jpowsour.2005.10.069
LANDI BJ, 2002, NANO LETT, V2, P1329, DOI 10.1021/nl025800h
LEE D, 2006, NANO LETT, V6, P2305, DOI 10.1021/nl061776m
LI WZ, 2003, J PHYS CHEM B, V107, P6292, DOI 10.1021/jp022505c
LI WZ, 2005, LANGMUIR, V21, P9386, DOI 10.1021/la051124y
LIN J, 1998, SCIENCE, V280, P1253
LIU P, 2005, EUR POLYM J, V41, P2693, DOI
10.1016/j.europolymj.2005.05.017
MAMEDOV AA, 2002, NAT MATER, V1, P190, DOI 10.1038/nmat747
MENDELSOHN JD, 2000, LANGMUIR, V16, P5017
MICHEL M, 2007, ADV MATER, V19, P3859, DOI 10.1002/adma.200701219
MORRIS RS, 2004, J POWER SOURCES, V138, P277, DOI
10.1016/j.jpowsour.2004.06.014
MURPHY H, 2006, J VAC SCI TECHNOL B, V24, P715, DOI 10.1116/1.2180257
NAKASHIMA N, 2002, CHEM LETT 0605, P638
OCONNELL MJ, 2001, CHEM PHYS LETT, V342, P265
OLEK M, 2004, NANO LETT, V4, P1889, DOI 10.1021/048950w
PALONIEMI H, 2006, LANGMUIR, V22, P74, DOI 10.1021/la051763i
PUSHPARAJ VL, 2007, P NATL ACAD SCI USA, V104, P13574
RAMANATHAN T, 2005, CHEM MATER, V17, P1290, DOI 10.1021/cm048357f
SATAKE A, 2005, CHEM MATER, V17, P716, DOI 10.1021/cm048549a
SHAIJUMON MM, 2008, CHEM COMMUN 0528, P2373, DOI 10.1039/b800866c
SHARP JS, 2002, PHYS REV E 1, V66, ARTN 011801
SHIMODA H, 2002, PHYS REV LETT, V88, ARTN 015502
SHIRATORI SS, 2000, MACROMOLECULES, V33, P4213
SMAJDA R, 2007, CARBON, V45, P1176, DOI 10.1016/j.carbon.2007.02.022
SUNG J, 2008, ADV MATER, V20, P1505, DOI 10.1002/adma.200701535
TAGLIAZUCCHI M, 2007, J PHYS CHEM B, V111, P8105, DOI 10.1021/jp071867n
TAGLIAZUCCHI M, 2008, J PHYS CHEM C, V112, P458, DOI 10.1021/jp073t23f
TOMPKINS HGI, 2005, HDB ELLIPSOMETRY
WANG C, 2004, NANO LETT, V4, P345, DOI 10.1021/nl034952p
WU ZC, 2004, SCIENCE, V305, P1273
YOON BJ, 2004, CHEM PHYS LETT, V388, P170, DOI
10.1016/j.cplett.2004.02.071
ZHANG MN, 2004, LANGMUIR, V20, P8781, DOI 10.1021/la048923l
ZHANG MN, 2006, CARBON, V44, P276, DOI 10.1016/j.carbon.2005.07.021
NR 53
TC 0
PU AMER CHEMICAL SOC; 1155 16TH ST, NW, WASHINGTON, DC 20036 USA
SN 0002-7863
DI 10.1021/ja807059k
PD JAN 21
VL 131
IS 2
BP 671
EP 679
SC Chemistry, Multidisciplinary
GA 395KA
UT ISI:000262521800057
ER
EF
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