Cited Article: Majumder M. Nanoscale hydrodynamics - Enhanced flow in carbon nanotubes
Alert Expires: 18 OCT 2009
Number of Citing Articles: 3 new records this week (3 in this e-mail)
Organization ID: 3b97d1bbc1878baed0ab183d8b03130b
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Title:
H+ Ion Migration in Water Filled Carbon Nanotube
Authors:
Lee, SH
Author Full Names:
Lee, Song Hi
Source:
BULLETIN OF THE KOREAN CHEMICAL SOCIETY 30 (3): 700-702 MAR 20 2009
Language:
English
Document Type:
Article
Author Keywords:
Molecular dynamics simulation; OSS2 potential; Proton transfer; Carbon nanotube
KeyWords Plus:
MOLECULAR-DYNAMICS; SOLVATED PROTON; SIMULATIONS; TRANSPORT; MODELS; FLOW
Reprint Address:
Lee, SH, Kyungsung Univ, Dept Chem, Pusan 608736, South Korea.
Research Institution addresses:
Kyungsung Univ, Dept Chem, Pusan 608736, South Korea
E-mail Address:
shlee@ks.ac.kr
Cited References:
BEREZHKOVSKII A, 2002, PHYS REV LETT, V89, ARTN 064503.
BJERRUM N, 1952, SCIENCE, V115, P385.
DELLAGO C, 2003, PHYS REV LETT, V90, ARTN 105902.
DELLAGO C, 2006, PHYS REV LETT, V97, ARTN 245901.
GEAR WC, 1971, NUMERICAL INITIAL VA.
HASSAN SA, 2006, J CHEM PHYS, V124, ARTN 204510.
HOLT JK, 2006, SCIENCE, V312, P1034, DOI 10.1126/science.1126298.
IIJIMA S, 1991, NATURE, V354, P56.
LEE SM, 2001, B KOR CHEM SOC, V22, P847.
MAJUMDER M, 2005, NATURE, V438, P44, DOI 10.1038/43844a.
MILLER SA, 2001, J AM CHEM SOC, V123, P12335.
OJAMAE L, 1998, J CHEM PHYS, V109, P5547.
VUILLEUMIER R, 1999, J CHEM PHYS, V111, P4251.
WAGHE A, 2002, J CHEM PHYS, V117, P10789, DOI 10.1063/1.1519861.
WIND SJ, 2002, APPL PHYS LETT, V80, P3817.
ZHU FQ, 2003, BIOPHYS J, V85, P236.
Cited Reference Count:
16
Times Cited:
0
Publisher:
KOREAN CHEMICAL SOC; 635-4 YEOGSAM-DONG, KANGNAM-GU, SEOUL 135-703, SOUTH KOREA
Subject Category:
Chemistry, Multidisciplinary
ISSN:
0253-2964
IDS Number:
433XV
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Title:
IDENTIFYING THE MECHANISMS OF ENHANCED WATER FLOW THROUGH CARBON NANOTUBES
Authors:
Thomas, JA; McGaughey, AJH
Author Full Names:
Thomas, J. A.; McGaughey, A. J. H.
Source:
IMECE 2008: HEAT TRANSFER, FLUID FLOWS, AND THERMAL SYSTEMS, VOL 10, PTS A-C : 39-42 2009
Language:
English
Document Type:
Proceedings Paper
KeyWords Plus:
HYDRODYNAMICS
Abstract:
Pressure-driven water flow through carbon nanotubes (CNTs) with diameters ranging from 1.66 nm to 4.99 nm is examined using molecular dynamics simulation. The flow rate enhancement, defined as the ratio of the observed flow rate to that predicted from the no-slip Hagen-Poiseuille relation, is calculated for each CNT The enhancement decreases with increasing CNT diameter and ranges from 433 to 47. By calculating the variation of water viscosity and slip length as a function of CNT diameter, it is found that the results can be fully explained in the context of continuum fluid mechanics. The enhancements are lower than previously reported experimental results, which range from 560 to 100000, suggesting a miscalculation of the available flow area and/or the presence of an uncontrolled external driving force (such as an electricfield) in the experiments.
Reprint Address:
McGaughey, AJH, Carnegie Mellon Univ, Dept Mech Engn, Pittsburgh, PA 15213 USA.
Research Institution addresses:
[Thomas, J. A.; McGaughey, A. J. H.] Carnegie Mellon Univ, Dept Mech Engn, Pittsburgh, PA 15213 USA
Cited References:
ALLEN MP, 1987, COMPUTER SIMULATION.
BARRAT JL, 2003, MOL PHYS, V101, P1605, DOI 10.1080/0026897031000068578.
HANASAKI I, 2006, J CHEM PHYS, V124, P44708.
HEYES DM, 1998, LIQUID STATE APPL MO.
HOLT JK, 2006, SCIENCE, V312, P1034, DOI 10.1126/science.1126298.
JOSEPH P, 2005, PHYS REV E 2, V71, P5303.
JOSEPH P, 2006, PHYS REV LETT, V97, P6104.
JOSEPH S, 2008, NANO LETT, V8, P452, DOI 10.1021/nl072385q.
LI J, 1998, PHYS REV E, V57, P7259.
MAHONEY MW, 2000, J CHEM PHYS, V112, P8910.
MAJUMDER M, 2005, NATURE, V438, P44, DOI 10.1038/43844a.
MCQUARRIE DA, 2005, STAT MECH.
PETRAVIC J, 2007, J CHEM PHYS, V127, P74706.
SINHA S, 2007, PHYS FLUIDS, V19, P13603.
SOKHAN VP, 2002, J CHEM PHYS, V117, P8531, DOI 10.1063/1.1512643.
STRIOLO A, 2006, NANO LETT, V6, P633, DOI 10.1021/nl052254u.
THOMAS JA, 2008, J CHEM PHYS, V128, P84715.
THOMAS JA, 2008, NANO LETT IN PRESS.
TRAVIS KP, 1997, PHYS REV E, V55, P4288.
WANG Z, 2007, NANO LETT, V7, P679.
WERDER T, 2003, J PHYS CHEM B, V107, P1345, DOI 10.1021/jp0268112.
WHITBY M, 2008, NANO LETT IN PRESS.
YONGLI S, 2007, COMP MATER SCI, V38, P737.
Cited Reference Count:
23
Times Cited:
0
Publisher:
AMER SOC MECHANICAL ENGINEERS; THREE PARK AVENUE, NEW YORK, NY 10016-5990 USA
IDS Number:
BJE16
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Title:
EFFECT OF GEOMETRIC PARAMETERS OF SUPERHYDROPHOBIC SURFACE ON LIQUID SLIP
Authors:
Lee, C; Choi, CH; Kim, CJ
Author Full Names:
Lee, Choongyeop; Choi, Chang-Hwan; Kim, Chang-Jin C. J.
Source:
IMECE 2008: HEAT TRANSFER, FLUID FLOWS, AND THERMAL SYSTEMS, VOL 10, PTS A-C : 77-86 2009
Language:
English
Document Type:
Proceedings Paper
Author Keywords:
superhydrophobic surface; liquid slip; wetting transition; drag reduction
KeyWords Plus:
DRAG REDUCTION; CARBON NANOTUBES; ROUGH SURFACES; FRICTION; FLOWS; WATER; MICROFLUIDICS; MICROCHANNELS; TRANSITIONS; RESISTANCE
Abstract:
In this paper, we experimentally study how geometric parameters of textured hydrophobic surfaces affect a liquid slip, empowered by a custom-tuned microfabrication procedure that produces regular micro-patterns of posts and grates on an entire 4" wafer with a good size uniformity and no defect. A pitch of the patterns and a gas fraction of the structured surface are independently controlled, and the slip length over each type of patterns is measured using a rheometer system. On both grates and posts, the slip length increases linearly with a pitch but exponentially with a gas fraction. The trend of exponential increase by gas fraction appears more pronounced on posts than on grates. The defect-free surfaces allow the flows to maintain a de-wetted (Cassie) state at much higher pitches and gas fractions than previously possible, permitting flows with the maximum slip effect.
Reprint Address:
Lee, C, Univ Calif Los Angeles, Los Angeles, CA 90095 USA.
Research Institution addresses:
[Lee, Choongyeop; Kim, Chang-Jin C. J.] Univ Calif Los Angeles, Los Angeles, CA 90095 USA
Cited References:
AJDARI A, 2006, PHYS REV LETT, V96, P6102.
BALASUBRAMANIAN AK, 2004, AIAA J, V42, P411.
BARBIERI L, 2007, LANGMUIR, V23, P1723, DOI 10.1021/la0617964.
BIBEN T, 2008, PHYS REV LETT, V100, P6103.
BLOSSEY R, 2003, NAT MATER, V2, P301, DOI 10.1038/nmat856.
CASSIE ABD, 1944, T FARADAY SOC, V40, P546.
CHOI CH, 2003, PHYS FLUIDS, V15, P2897, DOI 10.1063/1.1605425.
CHOI CH, 2006, PHYS FLUIDS, V18, P87105.
CHOI CH, 2006, PHYS REV LETT, V96, ARTN 066001.
CHOI CH, 2006, PHYS REV LETT, V97, P9601.
COTTINBIZONNE C, 2003, NAT MATER, V2, P237, DOI 10.1038/nmat857.
COTTINBIZONNE C, 2004, EUR PHYS J E, V15, P427, DOI 10.1140/epje/i2004-10061-9.
EIJKEL J, 2007, LAB CHIP, V7, P299, DOI 10.1039/b700364c.
EXTRAND CW, 2004, LANGMUIR, V20, P5013, DOI 10.1021/la036481s.
EXTRAND CW, 2006, LANGMUIR, V22, P1711, DOI 10.1021/la0525401.
GOGTE S, 2005, PHYS FLUIDS, V17, P51701.
HOLT JK, 2006, SCIENCE, V312, P1034, DOI 10.1126/science.1126298.
ISHINO C, 2004, EUROPHYS LETT, V68, P419, DOI 10.1209/epl/i2004-10206-6.
JOSEPH P, 2006, PHYS REV LETT, V97, P6104.
KIM JW, 2002, PROC IEEE MICR ELECT, P479.
LAUGA E, 2003, J FLUID MECH, V489, P55, DOI 10.1017/S0022112003004695.
MAJUMDER M, 2005, NATURE, V438, P44, DOI 10.1038/43844a.
MIN TG, 2004, PHYS FLUIDS, V16, L55, DOI 10.1063/1.1755723.
MOULINET S, 2007, EUR PHYS J E, V24, P251, DOI 10.1140/epje/i2007-10235-y.
NAKAJIMA A, 2001, MONATSH CHEM, V132, P31.
OU J, 2004, PHYS FLUIDS, V16, P4635, DOI 10.1063/1.1812011.
PATANKAR NA, 2003, LANGMUIR, V19, P1249, DOI 10.1021/la026612+.
PHILIP JR, 1972, Z ANGEW MATH PHYS, V23, P353.
PRIEZJEV NV, 2005, PHYS REV E 1, V71, P1608.
QUERE D, 2005, REP PROG PHYS, V68, P2495, DOI 10.1088/0034-4885/68/11/R01.
ROACH P, 2008, SOFT MATTER, V4, P224, DOI 10.1039/b712575p.
SBRAGAGLIA M, 2006, PHYS REV LETT, V97, P4503.
SBRAGAGLIA M, 2007, J FLUID MECH, V578, P435.
STEINBERGER A, 2007, NAT MATER, V6, P665, DOI 10.1038/nmat1962.
WATANABE K, 1999, J FLUID MECH, V381, P225.
WENZEL RN, 1936, IND ENG CHEM, V28, P988.
WHITE FM, 1994, FLUID MECH, CH7.
YBERT C, 2007, PHYS FLUIDS, V19, P23601.
ZHENG QS, 2005, LANGMUIR, V21, P12207, DOI 10.1021/la052054y.
Cited Reference Count:
39
Times Cited:
0
Publisher:
AMER SOC MECHANICAL ENGINEERS; THREE PARK AVENUE, NEW YORK, NY 10016-5990 USA
IDS Number:
BJE16
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