Thursday, February 25, 2010

ISI Web of Knowledge Alert - Majumder M

ISI Web of Knowledge Citation Alert

Cited Article: Majumder M. Nanoscale hydrodynamics - Enhanced flow in carbon nanotubes
Alert Expires: 09 NOV 2010
Number of Citing Articles: 1 new records this week (1 in this e-mail)
Organization ID: 3b97d1bbc1878baed0ab183d8b03130b
========================================================================
Note: Instructions on how to purchase the full text of an article and Help Desk Contact information are at the end of the e-mail.
========================================================================

*Record 1 of 1.
*View Full Record: http://gateway.isiknowledge.com/gateway/Gateway.cgi?GWVersion=2&SrcAuth=Alerting&SrcApp=Alerting&DestApp=WOS&DestLinkType=FullRecord;KeyUT=000274424800033
*Order Full Text [ ]

Title:
CORE-TUBE MORPHOLOGY OF MULTIWALL CARBON NANOTUBES

Authors:
Sato, M; Shima, H; Iiboshi, K

Author Full Names:
Sato, Motohiro; Shima, Hiroyuki; Iiboshi, Kohtaroh

Source:
INTERNATIONAL JOURNAL OF MODERN PHYSICS B 24 (1-2): 288-294 JAN 20 2010

Language:
English

Document Type:
Proceedings Paper

Author Keywords:
Carbon nanotube; cross-sectional deformation; hydrostatic pressure

KeyWords Plus:
HYDROSTATIC-PRESSURE; SENSORS; MODEL; FLOW

Abstract:
The present paper investigates the cross-sectional morphology of Multiwalled Carbon Nanotubes (MWNTs) restrained radially and circumferentially by an infinite surrounding elastic medium, subjected to uniform external hydrostatic pressure. In this study, a two-dimensional plane strain model is developed, assuming no variation of load and deformation along the tube axis. We find some characteristic cross-sectional shapes from the elastic buckling analysis. The effect of the surrounded elastic medium on the cross-sectional shape which occurs due to pressure buckling is focused on by the comparison with the shape for no elastic medium case in our discussion. It is suggested that in no embedded elastic medium cases, the cross-sectional shapes of inner tubes maintain circle or oval; on the other hand, an embedded medium may cause inner tube corrugation modes especially when the number of shells for MWNTs is small.

Reprint Address:
Sato, M, Hokkaido Univ, Grad Sch Engn, Dept Socioenvironm Engn, Sapporo, Hokkaido 0608628, Japan.

Research Institution addresses:
[Sato, Motohiro; Iiboshi, Kohtaroh] Hokkaido Univ, Grad Sch Engn, Dept Socioenvironm Engn, Sapporo, Hokkaido 0608628, Japan; [Shima, Hiroyuki] Hokkaido Univ, Grad Sch Engn, Dept Appl Phys, Sapporo, Hokkaido 0608628, Japan; [Shima, Hiroyuki] Univ Politecn Cataluna, Dept Appl Math 3, LaCaN, ES-08034 Barcelona, Spain

E-mail Address:
tayu@eng.hokudai.ac.jp; shima@eng.hokudai.ac.jp; iiboshi@eng.hokudai.ac.jp

Cited References:
ARIAS I, 2008, PHYS REV LETT, V100, ARTN 085503.
ARROYO M, 2008, J MECH PHYS SOLIDS, V56, P1224, DOI 10.1016/j.jmps.2007.10.001.
BARBOZA APM, 2008, PHYS REV LETT, V100, ARTN 256804.
CAI JZ, 2006, PHYS REV LETT, V97, ARTN 026402.
CHANG TC, 2008, APPL PHYS LETT, V93, ARTN 061901.
DACOSTA RCT, 1981, PHYS REV A, V23, P1982.
DEACON RS, 2006, PHYS REV B, V74, ARTN 201402.
FRACKOWIAK E, 2002, CARBON, V40, P1775.
GOMEZNAVARRO C, 2006, PHYS REV LETT, V96, ARTN 076803.
HE XQ, 2005, J MECH PHYS SOLIDS, V53, P303, DOI 10.1016/j.jmps.2004.08.003.
HUANG Y, 2006, PHYS REV B, V74, ARTN 245413.
JOSEPH S, 2008, NANO LETT, V8, P452, DOI 10.1021/nl072385q.
KHOSRAVIAN N, 2008, NANOTECHNOLOGY, V19, ARTN 275703.
LEBEDKIN S, 2006, PHYS REV B, V73, ARTN 094109.
LI C, 2008, COMPOS SCI TECHNOL, V68, P1227, DOI 10.1016/j.compscitech.2008.01.006.
LONGHURST MJ, 2007, PHYS REV LETT, V98, ARTN 145503.
LU WB, 2009, APPL PHYS LETT, V94, ARTN 101917.
MAJUMDER M, 2005, NATURE, V438, P44, DOI 10.1038/43844a.
MATTIA D, 2008, MICROFLUID NANOFLUID, V5, P289, DOI 10.1007/s10404-008-0293-5.
MONTEVERDE M, 2006, PHYS REV LETT, V97, ARTN 176401.
MONTHIOUX M, 2002, CARBON, V40, P1809.
NISHIO T, 2008, APPL PHYS LETT, V92, ARTN 063117.
NOY A, 2007, NANO TODAY, V2, P22.
ONO S, 2009, PHYS REV B, V79, ARTN 235407.
ONO S, 2010, PHYSICA E, DOI 10.1016/J.PHYSE.2009.11.103.
PARK CJ, 1999, PHYS REV B, V60, P10656.
PENG J, 2008, J MECH PHYS SOLIDS, V56, P2213, DOI 10.1016/j.jmps.2008.01.004.
POPOV VN, 2004, MAT SCI ENG R, V43, P61, DOI 10.1016/j.mser.2003.10.001.
REN Y, 2009, APPL PHYS LETT, V94, ARTN 183506.
RU CQ, 2000, PHYS REV B, V62, P16962.
SATO M, 2009, INTERACT MULTI MECH, V2, P209.
SEARS A, 2004, PHYS REV B, V69, ARTN 235406.
SHANAVAS KV, 2009, PHYS REV B, V79, ARTN 155425.
SHEN HS, 2004, INT J SOLIDS STRUCT, V41, P2643, DOI 10.1016/j.ijsolstr.2003.11.028.
SHIMA H, UNPUB.
SHIMA H, 2008, NANOTECHNOLOGY, V19, ARTN 495705.
SHIMA H, 2009, PHYS REV B, V79, ARTN 201401.
SHIMA H, 2009, PHYS STATUS SOLIDI A, V206, P2228, DOI 10.1002/pssa.200881706.
SHIMA H, 2010, PHYS E IN PRESS, DOI 10.1016/J.PHYSE.2009.10.030.
SINHA N, 2006, J NANOSCI NANOTECHNO, V6, P573, DOI 10.1166/jnn.2006.121.
TAIRA H, J PHYS CONDENS UNPUB.
TANG J, 2000, PHYS REV LETT, V85, P1887.
TASIS D, 2006, CHEM REV, V106, P1105, DOI 10.1021/cr050569o.
VENKATESWARAN UD, 1999, PHYS REV B, V59, P10928.
WHITBY M, 2007, NAT NANOTECHNOL, V2, P87, DOI 10.1038/nnano.2006.175.
YANG CK, 2003, PHYS REV LETT, V90, ARTN 257203.
YAO MG, 2008, PHYS REV B, V78, ARTN 205411.
ZHANG SL, 2006, PHYS REV B, V73, ARTN 075423.
ZHANG T, 2008, NANOTECHNOLOGY, V19, ARTN 332001.
ZOU J, 2009, J APPL PHYS, V105, ARTN 033516.

Cited Reference Count:
50

Times Cited:
0

Publisher:
WORLD SCIENTIFIC PUBL CO PTE LTD; 5 TOH TUCK LINK, SINGAPORE 596224, SINGAPORE

Subject Category:
Physics, Applied; Physics, Condensed Matter; Physics, Mathematical

ISSN:
0217-9792

DOI:
10.1142/S0217979210064228

IDS Number:
554GZ

========================================================================
*Order Full Text*
All Customers
--------------
Please contact your library administrator, or person(s) responsible for
document delivery, to find out more about your organization's policy for
obtaining the full text of the above articles. If your organization does
not have a current document delivery provider, your administrator can
contact ISI Document Solution at service@isidoc.com, or call 800-603-4367
or 734-459-8565.

IDS Customers
--------------
IDS customers can purchase the full text of an article (having page number,
volume, and issue information) by returning this ENTIRE message as a Reply
to Sender or Forward to orders@isidoc.com. Mark your choices with an X in
the "Order Full Text: []" brackets for each item. For example, [X].

Please enter your account number here:

========================================================================
*Help Desk Contact Information*
If you have any questions, please visit the Thomson Scientific Technical Support Contact Information Web page:
http://www.thomsonscientific.com/support/techsupport
========================================================================

No comments: