Cited Article: Thompson, P. A general boundary condition for liquid flow at solid surfaces
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Title:
Scale effect on flow and thermal boundaries in micro-/nano-channel flow using molecular dynamics-continuum hybrid simulation method
Authors:
Sun, J; He, YL; Tao, WQ
Author Full Names:
Sun, Jie; He, Ya-Ling; Tao, Wen-Quan
Source:
INTERNATIONAL JOURNAL FOR NUMERICAL METHODS IN ENGINEERING 81 (2): 207-228 JAN 8 2010
Language:
English
Document Type:
Article
Author Keywords:
molecular dynamics simulation; finite volume method; hybrid simulation; velocity slip; temperature jump; micro-/nano-fluidics
KeyWords Plus:
HEAT-TRANSFER; ATOMISTIC SIMULATION; LIQUID ARGON; FLUID-FLOWS; SURFACE; MODEL; SIZE; DSMC; MEMS
Abstract:
The molecular dynamics (MD)-continuum hybrid simulation method has been developed in two aspects in the present work: (1) The energy equation has been combined into the coupling method in order to obtain the hybrid temperature profile and (2) the coupling method has been improved by the local linearization to obtain a smoother parametric profile. The developed method is primarily validated by analytical Solutions and full MD results. Then, it is employed to Study the scale effect oil the flow and thermal boundaries in micro-/nano-channel flow. The hybrid velocity and temperature profiles are obtained with the channel height (H) ranging from 60 sigma to 2014 sigma and the solid-liquid coupling (beta) ranging from 0.1 to 50. Scale effect has shown strong influence on the boundaries. Obvious slip characteristics can be found in the profiles, i.e. velocity slip and temperature jump, when H is small and beta is large. However, the results also show that the profiles can be well p!
redicted to converge to the macroscale non-slip/non-jump analytical when H is large enough, where the effect of beta can be omitted and the slip characteristics disappear. Correlations of relative slip length, relative temperature jump and pressure gradient with H are fitted from the simulation results. Copyright (C) 2009 John Wiley & Sons, Ltd.
Reprint Address:
He, YL, Xi An Jiao Tong Univ, Sch Energy & Power Engn, State Key Lab Multiphase Flow Power Engn, Xian 710049, Shaanxi, Peoples R China.
Research Institution addresses:
[Sun, Jie; He, Ya-Ling; Tao, Wen-Quan] Xi An Jiao Tong Univ, Sch Energy & Power Engn, State Key Lab Multiphase Flow Power Engn, Xian 710049, Shaanxi, Peoples R China
E-mail Address:
yalinghe@mail.xjtu.edu.cn
Cited References:
*NIST, 2005, THERM PROP FLUID SYS.
ALLEN MP, 1987, COMPUTER SIMULATION.
CRAIGHEAD HG, 2000, SCIENCE, V290, P1535.
DELGADOBUSCALIONI R, 2003, PHYS REV E 2, V67, ARTN 046704.
DELGADOBUSCALIONI R, 2005, PHILOS T R SOC A, V363, P1975, DOI 10.1098/rsta.2005.1623.
E W, 2007, COMMUN COMPUT PHYS, V2, P367.
FLEKKOY EG, 2000, EUROPHYS LETT, V52, P271.
GADELHAK M, 1999, T ASME, V121, P5.
GRAVESEN P, 1993, J MICROMECH MICROENG, V3, P168.
GUO ZY, 2003, INT J HEAT MASS TRAN, V46, P149.
HADJICONSTANTIN.NG, 2005, B POL ACAD SCI-TECH, V53, P335.
HADJICONSTANTINOU NG, 1999, J COMPUT PHYS, V154, P245.
HADJICOSTANTINOU NG, 1999, PHYS REV E B, V59, P2475.
HO CM, 1998, ANNU REV FLUID MECH, V30, P579.
KHORDAD R, 2008, PHYSICA A, V387, P4519, DOI 10.1016/j.physa.2008.03.025.
LIOU WW, 2001, J MICROELECTROMECH S, V10, P274.
LIU J, 2007, J COMPUT PHYS, V227, P279, DOI 10.1016/j.jcp.2007.07.014.
LOFDAHL L, 1999, PROG AEROSP SCI, V35, P101.
MARUYAMA S, 1999, THERMAL SCI ENG, V7, P63.
MARUYAMA S, 2000, ADV NUMERICAL HEAT T, CH6.
NAGAYAMA G, 2004, INT J HEAT MASS TRAN, V47, P501, DOI 10.1016/j.ijheatmasstransfer.2003.07.013.
NIE XB, 2004, J FLUID MECH, V500, P55, DOI 10.1017/S0022112003007225.
NIE XB, 2004, PHYS FLUIDS, V16, P3579, DOI 10.1063/1.1779531.
NIE XB, 2006, PHYS REV LETT, V96, ARTN 134501.
OCONNELL ST, 1995, PHYS REV E, V52, P5792.
RAPAPORT DC, 2004, ART MOL DYNAMICS SIM.
REN WQ, 2005, J COMPUT PHYS, V204, P1, DOI 10.1016/j.jcp.2004.10.001.
REN WQ, 2007, J COMPUT PHYS, V227, P1353, DOI 10.1016/j.jcp.2007.09.007.
STODDARD SD, 1973, PHYS REV A, V8, P1504.
SUN HW, 2000, NUMER HEAT TR A-APPL, V38, P153.
TAO WQ, 2008, P MICR NAN HEAT TRAN.
THOMPSON PA, 1997, NATURE, V389, P360.
VERSTEEG HK, 1995, INTRO COMPUTATIONAL.
VOGELSANG R, 1987, J CHEM PHYS, V86, P6371.
WAGNER G, 2002, COMPUT PHYS COMMUN, V147, P670.
WANG YC, 2007, CHEM ENG SCI, V62, P3574, DOI 10.1016/j.ces.2006.12.093.
WERDER T, 2005, J COMPUT PHYS, V205, P373, DOI 10.1016/j.jcp.2004.11.019.
XU JL, 2004, INT J NUMER METHOD H, V14, P664, DOI 10.1108/09615530410539973.
XU JL, 2007, INT J HEAT MASS TRAN, V50, P2571, DOI 10.1016/j.ijheatmasstransfer.2006.11.031.
YEN TH, 2007, MICROFLUID NANOFLUID, V3, P665, DOI 10.1007/s10404-007-0154-7.
YI P, 2002, INT J HEAT MASS TRAN, V45, P2087.
Cited Reference Count:
41
Times Cited:
0
Publisher:
JOHN WILEY & SONS LTD; THE ATRIUM, SOUTHERN GATE, CHICHESTER PO19 8SQ, W SUSSEX, ENGLAND
Subject Category:
Engineering, Multidisciplinary; Mathematics, Interdisciplinary Applications
ISSN:
0029-5981
DOI:
10.1002/nme.2683
IDS Number:
544PN
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